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Lecture Notes in Electrical Engineering

Efficient Test Methodologies for High-Speed Serial Links

Authors: Dongwoo, Hong, Cheng, Kwang-Ting

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  • Overview of state-of-the-art testing techniques for high-speed serial links
  • Analysis of clock and data recovery circuits’ characteristics and their effects on system performance
  • Analysis of jitter characteristics and its measurement techniques
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eBook $129.00
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  • ISBN 978-90-481-3443-4
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Hardcover $169.99
price for USA in USD
  • ISBN 978-90-481-3442-7
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  • Institutional customers should get in touch with their account manager
  • Covid-19 shipping restrictions
  • Usually ready to be dispatched within 3 to 5 business days, if in stock
Softcover $189.00
price for USA in USD
  • ISBN 978-94-007-3094-6
  • Free shipping for individuals worldwide
  • Institutional customers should get in touch with their account manager
  • Covid-19 shipping restrictions
  • Usually ready to be dispatched within 3 to 5 business days, if in stock
About this book

With the increasing demand for higher data bandwidth, communication systems’ data rates have reached the multi-gigahertz range and even beyond. Advances in semiconductor technologies have accelerated the adoption of high-speed serial interfaces, such as PCI-Express, Serial-ATA, and XAUI, in order to mitigate the high pin-count and the data-channel skewing problems. However, with the increasing number of I/O pins and greater data rates, significant challenges arise for testing high-speed interfaces in terms of test cost and quality, especially in high volume manufacturing (HVM) environments. Efficient Test Methodologies for High-Speed Serial Links describes in detail several new and promising techniques for cost-effectively testing high-speed interfaces with a high test coverage. One primary focus of Efficient Test Methodologies for High-Speed Serial Links is on efficient testing methods for jitter and bit-error-rate (BER), which are widely used for quantifying the quality of a communication system. Various analysis as well as experimental results are presented to demonstrate the validity of the presented techniques.

Table of contents (8 chapters)

Table of contents (8 chapters)

Buy this book

eBook $129.00
price for USA in USD
  • ISBN 978-90-481-3443-4
  • Digitally watermarked, DRM-free
  • Included format: EPUB, PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $169.99
price for USA in USD
  • ISBN 978-90-481-3442-7
  • Free shipping for individuals worldwide
  • Institutional customers should get in touch with their account manager
  • Covid-19 shipping restrictions
  • Usually ready to be dispatched within 3 to 5 business days, if in stock
Softcover $189.00
price for USA in USD
  • ISBN 978-94-007-3094-6
  • Free shipping for individuals worldwide
  • Institutional customers should get in touch with their account manager
  • Covid-19 shipping restrictions
  • Usually ready to be dispatched within 3 to 5 business days, if in stock
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Bibliographic Information

Bibliographic Information
Book Title
Efficient Test Methodologies for High-Speed Serial Links
Authors
Series Title
Lecture Notes in Electrical Engineering
Series Volume
51
Copyright
2010
Publisher
Springer Netherlands
Copyright Holder
Springer Science+Business Media B.V.
eBook ISBN
978-90-481-3443-4
DOI
10.1007/978-90-481-3443-4
Hardcover ISBN
978-90-481-3442-7
Softcover ISBN
978-94-007-3094-6
Series ISSN
1876-1100
Edition Number
1
Number of Pages
XII, 98
Topics