Editors

EDITOR-IN-CHIEF
Dr. Sanjay Yadav, CSIR-National Physical Laboratory, New Delhi, India

MANAGING EDITORS
Dr. S. K. Jaiswal, CSIR-National Physical Laboratory, New Delhi, India
Dr. Naveen Garg, CSIR-National Physical Laboratory, New Delhi, India

ASSOCIATE EDITORS

Dr. Ravinder Agarwal, Thapar University, Patiala, Punjab, India
Dr. Ashish Agarwal, CSIR-National Physical Laboratory, New Delhi, India
Dr. Shankar G. Aggarwal, CSIR-National Physical Laboratory, New Delhi, India
Dr. Kamlesh Patel, University of Delhi, New Delhi, India
Dr. K.S. Nagla, National Institute of Technology (NIT), Jalandhar, India
Dr. Devraj Singh, Amity School of Engineering and Technology, Delhi, India

EDITORAL BOARD
Dr. D. K. Aswal, CSIR–National Physical Laboratory, New Delhi, India
Dr. Martin Milton, BIPM, France
Dr. Thomas Liew, Agency for Science, Technology and Research (A*STAR), Singapore
Dr. Wolfram Bremser, BAM Federal Institute for Materials Research & Testing (BAM), Berlin, Germany
Dr. Joachim Fischer, Physikalisch-Technische Bundesanstalt (PTB), Berlin, Germany
Dr. Sam-Yong Woo, Korea Research Institute of Standards and Science (KRISS), Daejeon, Republic of Korea
Dr. T.J.B.M. Janssen, National Physical Laboratory, Middlesex, UK
Dr. Takashi Usuda, National Metrology Institute of Japan (NMIJ), lbaraki, Japan
Dr. Toshiyuki Takatsuji, National Metrology Institute of Japan (NMIJ), lbaraki, Japan
Mr. A. K. Saxena, Ex-scientist, CSIR–National Physical Laboratory, New Delhi, India
Dr. Costas Varotsos, National and Kapodistrian University of Athens, Athens, Greece
Dr. Peter Fisk, National Measurement Institute (NMI), West Lindfield NSW, Australia
Dr. Ma Liandi, National Institute of Metrology (NIM), Beijing, China
Mr. Ian Veldman, National Metrology Institute of South Africa (NMISA), Pretoria, South Africa
Dr. K.P Chaudhary, Ex-scientist, CSIR–National Physical Laboratory, New Delhi, India
Dr. Douglas Olson, National Institute of Standards and Technology (NIST), Gaithersburg, USA
Dr. Ranjana Mehrotra, CSIR–National Physical Laboratory, New Delhi, India
Mr. Anil Kumar, CSIR–National Physical Laboratory, New Delhi, India
Dr. Vinay Shankar Pandey, National Institute of Technology (NIT), Delhi
Dr. J. C. Torres-Guzmán, Centro Nacional de Metrología (CENAM), Mexico
Dr. A. Sengupta, Ex-scientist, CSIR–National Physical Laboratory, New Delhi, India
Dr. Seng-Jue Chen, CMS/ITRC, Taiwan
Dr. Rajveer Singh, Ambedkar Institute of Advanced Communication Technologies and Research, (AIACTR), New Delhi, India
Dr. B. P. Patel, Indian Institute of Technology Delhi, India
Dr. J.H. Shaw, CMS/ITRI, Taiwan
Dr. Tokihiko Kobata, National Metrology Institute of Japan (NMIJ), lbaraki, Japan
Dr. R. K. Kotnala, Ex-scientist, CSIR–National Physical Laboratory, New Delhi, India
Mr. Anil Agarwal, Measurement Science and Standards, National Research Council, Canada
Dr. Stuart Davidson, National Physical Laboratory (NPL), UK
Dr. Victoria Anne Coleman, National Measurement Institute (NMI), West Lindfield NSW, Australia