Hardware and Software Transparency in the Protection of Programs Against SEUs and SETs Eduardo Luis RhodCarlos Arthur Lang LisbôaMassimo Violante OriginalPaper 05 January 2008 Pages: 45 - 56
Scalability of Globally Asynchronous QCA (Quantum-Dot Cellular Automata) Adder Design Myungsu ChoiMinsu Choi OriginalPaper 04 January 2008 Pages: 313 - 320
Monomer Control for Error Tolerance in DNA Self-Assembly Byunghyun JangYong-Bin KimFabrizio Lombardi OriginalPaper 04 January 2008 Pages: 271 - 284
A Built-In Redundancy-Analysis Scheme for Random Access Memories with Two-Level Redundancy Da-Ming ChangJin-Fu LiYu-Jen Huang OriginalPaper 04 January 2008 Pages: 181 - 192
Performance-Optimized Design for Parametric Reliability Ramyanshu DattaJacob A. AbrahamKevin J. Nowka OriginalPaper 04 January 2008 Pages: 129 - 141
Circuit and Latch Capable of Masking Soft Errors with Schmitt Trigger Yoichi SasakiKazuteru NambaHideo Ito OriginalPaper 04 January 2008 Pages: 11 - 19
Improving the Effectiveness of Combinational Decompressors Through Judicious Partitioning of Scan Cells Ozgur Sinanoglu OriginalPaper 04 January 2008 Pages: 439 - 448
Guest Editorial Marcelo LubaszewskiAndrew RichardsonC. C. Su EditorialNotes 24 November 2007 Pages: 469 - 469
A Case Study on Phase-Locked Loop Automatic Layout Generation and Transient Fault Injection Analysis Cristiano LazzariRicardo A. L. ReisLorena Anghel Letter 21 November 2007 Pages: 625 - 633
A Design-Based Structural Test Method for a Switched-Resistor DAC Lei MaGeert SeurenLeon van der Dussen OriginalPaper 13 November 2007 Pages: 559 - 567
Fast PWM-Based Test for High Resolution ΣΔ ADCs Daniela De VenutoLeonardo Reyneri OriginalPaper 24 October 2007 Pages: 539 - 548
Hard-Fault Detection and Diagnosis During the Application of Model-Based Data Converter Testing Carsten WegenerMichael Peter Kennedy OriginalPaper 24 October 2007 Pages: 513 - 525
A Fully-Settled Linear Behavior Plus Noise Model for Evaluating the Digital Stimuli of the Design-for-Digital-Testability Σ-Δ Modulators Hao-Chiao Hong OriginalPaper 19 October 2007 Pages: 527 - 538
Reducing Test Time Using an Enhanced RF Loopback Marcelo NegreirosLuigi CarroAltamiro Amadeu Susin OriginalPaper 16 October 2007 Pages: 613 - 623
A Robust 130 nm-CMOS Built-In Current Sensor Dedicated to RF Applications M. CiminoH. LapuyadeJ. B. Bégueret OriginalPaper 12 October 2007 Pages: 593 - 603
Component Value Calculations and Characterizations for Measurements in the IEEE 1149.4 Environment Teuvo SaikkonenMarkku Moilanen OriginalPaper 11 October 2007 Pages: 569 - 579
Estimation of Test Metrics for the Optimisation of Analogue Circuit Testing Ahcène BounceurSalvador MirLuis Rolíndez OriginalPaper 11 October 2007 Pages: 471 - 484
Methods of Testing Discrete Semiconductors in the 1149.4 Environment Jari HannuMarkku Moilanen OriginalPaper 10 October 2007 Pages: 581 - 592
Oscillator-Based Reconfigurable Sinusoidal Signal Generator for ADC BIST Hsin-Wen TingCheng-Wu LinSoon-Jyh Chang OriginalPaper 10 October 2007 Pages: 549 - 558
Built-In Self-Test of Field Programmable Analog Arrays based on Transient Response Analysis T. R. BalenJ. V. CalvanoM. Renovell OriginalPaper 10 October 2007 Pages: 497 - 512
Oscillation Test Scheme of SC Biquad Filters Based on Internal Reconfiguration Uroš KačFranc Novak OriginalPaper 10 October 2007 Pages: 485 - 495
A Module for BiST of CMOS RF Receivers Kay SuenagaRodrigo PicosEugeni García OriginalPaper 09 October 2007 Pages: 605 - 612
A Novel EDA Tool for VLSI Test Vectors Management Walid Ibrahim OriginalPaper 21 September 2007 Pages: 421 - 434
Too Few or Too Many Properties? Measure it by ATPG! Franco FummiGraziano Pravadelli OriginalPaper 21 September 2007 Pages: 373 - 388
Dynamic Fault Diagnosis of Combinational and Sequential Circuits on Reconfigurable Hardware Fatih KocanDaniel G. Saab OriginalPaper 13 September 2007 Pages: 405 - 420
A System-layer Infrastructure for SoC Diagnosis P. BernardiM. GrossoM. Sonza Reorda OriginalPaper 13 September 2007 Pages: 389 - 404
Securing Scan Control in Crypto Chips David HélyFrédéric BancelBruno Rouzeyre OriginalPaper 12 September 2007 Pages: 457 - 464
Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge Circuits Luigi DililloPatrick GirardMagali Bastian OriginalPaper 11 September 2007 Pages: 435 - 444
Functional Constraints vs. Test Compression in Scan-Based Delay Testing Ilia PolianHideo Fujiwara OriginalPaper 09 September 2007 Pages: 445 - 455
IEEE Standard 1500 Compatible Oscillation Ring Test Methodology for Interconnect Delay and Crosstalk Detection Katherine Shu-Min LiChung-Len LeeJwu E Chen OriginalPaper 07 July 2007 Pages: 341 - 355
Functionally Fault-tolerant DSP Microprocessor using Sigma–delta Modulated Signals Erik SchülerMarcelo Ienczczak ErigsonLuigi Carro OriginalPaper 07 June 2007 Pages: 275 - 292
Techniques for Disturb Fault Collapsing Mohammad Gh. MohammadLaila Terkawi OriginalPaper 09 May 2007 Pages: 363 - 368
MDSI: Signal Integrity Interconnect Fault Modeling and Testing for SoCs Sunghoon ChunYongjoon KimSungho Kang OriginalPaper 09 May 2007 Pages: 357 - 362
Ensembles of Neural Networks for Fault Diagnosis in Analog Circuits M. A. El-GamalM. D. A. Mohamed OriginalPaper 09 May 2007 Pages: 323 - 339
A Formal Analysis of Fault Diagnosis with D-matrices J. W. SheppardS. G. W. Butcher OriginalPaper 09 May 2007 Pages: 309 - 322
The Effectiveness of Test in Controlling Quality Costs: A Conformability Analysis Based Approach J. M. GilbertI. M. Bell OriginalPaper 27 April 2007 Pages: 293 - 307
Cellular Array-based Delay-insensitive Asynchronous Circuits Design and Test for Nanocomputing Systems Jia DiParag K. Lala OriginalPaper 20 April 2007 Pages: 175 - 192
Built-in Self-test and Defect Tolerance in Molecular Electronics-based Nanofabrics Zhanglei WangKrishnendu Chakrabarty OriginalPaper 20 April 2007 Pages: 145 - 161
A Built-in Self-test and Diagnosis Strategy for Chemically Assembled Electronic Nanotechnology Jason G. BrownR. D. Blanton OriginalPaper 20 April 2007 Pages: 131 - 144
Designing Nanoscale Logic Circuits Based on Markov Random Fields K. NepalR. I. BaharA. Zaslavsky OriginalPaper 22 March 2007 Pages: 255 - 266
QCA Circuits for Robust Coplanar Crossing Sanjukta BhanjaMarco OttaviSalvatore Pontarelli OriginalPaper 22 March 2007 Pages: 193 - 210
Testing and Diagnosis of Realistic Defects in Digital Microfluidic Biochips Fei SuWilliam HwangKrishnendu Chakrabarty OriginalPaper 21 March 2007 Pages: 219 - 233
