Journal of Electronic Testing is among the journals recognized for Editorial Excellence. Editor-in-Chief Dr. Vishwani Agrawal performed in the top 10% of qualifying journals* based on data collected from the Journal Author Satisfaction survey. Click here for more information:

The Journal of Electronic Testing, the only journal specifically dedicated to electronic testing, is an international forum disseminating the latest research results and applications in the field. With its rapid submission to publication cycle, the journal quickly brings important findings to the attention of researchers and practitioners.

A partial list of topics covered in the journal includes: testing of VLSI devices, printed circuit boards, and electronic systems; fault modeling and simulation; test generation; design for testability; electron beam test systems; formal verification of hardware; simulation for verification; design debugging; economics of testing; quality and reliability; and CAD Tools.

In addition to original research papers, the journal publishes conference papers of exceptional merit. Readers will also find surveys and reviews examining the state of the art in the field.

  • Publishes the latest research results and applications in electronic testing
  • Features a rapid submission to publication cycle
  • Publishes conference papers of exceptional merit and surveys and reviews examining the state of the art in the field
  • 100% of authors who answered a survey reported that they would definitely publish or probably publish in the journal again

Journal information

Main Editor
  • Vishwani Agrawal
Publishing model
Hybrid (Transformative Journal). Learn about publishing Open Access with us

Journal metrics

0.596 (2019)
Impact factor
0.664 (2019)
Five year impact factor
85 days
Submission to first decision
188 days
Submission to acceptance
37,375 (2020)

Latest articles

This journal has 20 open access articles

Journal updates

  • COVID-19 and impact on peer review

    As a result of the significant disruption that is being caused by the COVID-19 pandemic we are very aware that many researchers will have difficulty in meeting the timelines associated with our peer review process during normal times.  Please do let us know if you need additional time. Our systems will continue to remind you of the original timelines but we intend to be highly flexible at this time.

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About this journal

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