Histogram-Based Calibration of Capacitor Mismatch and Comparator Offset for 1-Bit/Stage Pipelined ADCs Xuan-Lun HuangPing-Ying KangJiun-Lang Huang OriginalPaper 25 June 2011 Pages: 441 - 453
An Optimized Seed-based Pseudo-random Test Pattern Generator: Theory and Implementation Haijun SunYongjia ZengZhibiao Shao OriginalPaper 17 June 2011 Pages: 477 - 484
Pseudorandom Test of Nonlinear Analog and Mixed-Signal Circuits Based on a Volterra Series Model Joonsung ParkHongjoong ShinJacob A. Abraham OriginalPaper 31 May 2011 Pages: 321 - 334
Tungsten Lamps as an Affordable Light Source for Testing of Photovoltaic Cells Jeydmer AristizabalBadr OmraneCarlo Menon OriginalPaper 24 May 2011 Pages: 403 - 410
Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip Kihyuk HanJoonsung ParkJacob A. Abraham OriginalPaper 06 May 2011 Pages: 429 - 439
A Functional Verification Methodology Based on Parameter Domains for Efficient Input Stimuli Generation and Coverage Modeling Carlos Iván Castro MárquezEdgar Leonardo Romero TobarWang Jiang Chau OriginalPaper 03 May 2011 Pages: 485 - 503
Fault Detection, Diagnosis and Prediction in Electrical Valves Using Self-Organizing Maps Luiz Fernando GonçalvesJefferson Luiz BosaRenato Ventura Henriques OriginalPaper 12 April 2011 Pages: 551 - 564
Adaptive Modeling of Analog/RF Circuits for Efficient Fault Response Evaluation Gurusubrahmaniyan Subrahmaniyan RadhakrishnanSule Ozev OriginalPaper 12 April 2011 Pages: 465 - 476
Extending a DWDM Optical Network Test System to 12 Gbps x4 Channels Carl Edward GrayDavid C. Keezer OriginalPaper 09 April 2011 Pages: 351 - 361
Exploring the Limitations of Software-based Techniques in SEE Fault Coverage José Rodrigo AzambujaSamuel PagliariniFernanda Lima Kastensmidt OriginalPaper 09 April 2011 Pages: 541 - 550
A Java Framework to Specify Faultloads for Fault Injection Campaigns Ruthiano Simioni MunarettiTaisy Silva WeberBruno Coswig Fiss OriginalPaper 09 April 2011 Pages: 531 - 539
Functional Verification of DMA Controllers Michelangelo GrossoWilson Javier Perez HolguinJaime Velasco Medina OriginalPaper 09 April 2011 Pages: 505 - 516
Methodology to Replace Sensitivity BER and Transmit Power Production Tests in Bluetooth Devices with BiSTs Deepa MannathDavid CohenSimon S. Ang OriginalPaper 09 April 2011 Pages: 253 - 266
A Level-Crossing Approach for the Analysis of RF Modulated Signals Using Only Digital Test Resources Nicolas PousFlorence AzaïsJochen Rivoir OriginalPaper 08 April 2011 Pages: 289 - 303
Fault Tolerant Single Error Correction Encoders Juan Antonio MaestroPedro ReviriegoDhiraj K. Pradhan OriginalPaper 30 March 2011 Pages: 215 - 218
Structural Test Approach for Embedded Analog Circuits Based on a Built-in Current Sensor Román MozuelosYolanda LechugaSalvador Bracho OriginalPaper 30 March 2011 Pages: 177 - 192
Efficient Generation of Stimuli for Functional Verification by Backjumping Across Extended FSMs Giuseppe Di GuglielmoLuigi Di GuglielmoGraziano Pravadelli OriginalPaper 29 March 2011 Pages: 137 - 162
Embedded RF Circuit Diagnostic Technique with Multi-Tone Dither Scheme Sukeshwar KannanBruce KimCraig Force OriginalPaper 24 March 2011 Pages: 241 - 252
Construction and Analysis of Augmented Time Compactors Emil Gizdarski OriginalPaper 22 March 2011 Pages: 109 - 122
A Behavioral Model of MEMS Convective Accelerometers for the Evaluation of Design and Calibration Strategies at System Level Ahmed Amine RekikFlorence AzaïsPascal Nouet OriginalPaper 11 March 2011 Pages: 411 - 423
A Parallel Tester Architecture for Accelerometer and Gyroscope MEMS Calibration and Test Lyl M. Ciganda BrascaPaolo BernardiMaurizio Straiotto OriginalPaper 11 March 2011 Pages: 389 - 402
Test Vector Generation for Post-Silicon Delay Testing Using SAT-Based Decision Problems Desta TadesseR. Iris BaharJoel Grodstein OriginalPaper 09 March 2011 Pages: 123 - 136
Analysis of Resistive Open Defects in Drowsy SRAM Cells Afshin NourivandAsim J. Al-KhaliliYvon Savaria OriginalPaper 01 March 2011 Pages: 203 - 213
Assessment of Microfluidic System Testability using Fault Simulation and Test Metrics Thomas O. MyersIan M. Bell OriginalPaper 22 February 2011 Pages: 363 - 373
Balanced Secure Scan: Partial Scan Approach for Secret Information Protection Michiko InoueTomokazu YonedaHideo Fujiwara OriginalPaper 22 February 2011 Pages: 99 - 108
An Oscillation-Based Technique for Degradation Monitoring of Sensing and Actuation Electrodes Within Microfluidic Systems Qais Al-GayemAndrew RichardsonNick Burd OriginalPaper 18 February 2011 Pages: 375 - 387
Survey of Robustness Enhancement Techniques for Wireless Systems-on-a-Chip and Study of Temperature as Observable for Process Variations Marvin OnabajoDidac GómezJose Silva-Martinez OriginalPaper 09 February 2011 Pages: 225 - 240
Digital Test Method for Embedded Converters with Unknown-Phase Harmonics Vincent KerzérhoMariane ComteMichel Renovell OriginalPaper 08 February 2011 Pages: 335 - 350
An Asynchronous Design for Testability and Implementation in Thin-film Transistor Technology Chi-Hsuan ChengJames Chien-Mo Li OriginalPaper 08 February 2011 Pages: 193 - 201
Application of the Kalman Filter in Linearity Testing of Analog-to-Digital Converters Le Jin OriginalPaper 27 January 2011 Pages: 163 - 175
Analog Sinewave Signal Generators for Mixed-Signal Built-in Test Applications Manuel J. BarragánDiego VázquezAdoración Rueda OriginalPaper 08 January 2011 Pages: 305 - 320
Alternate Test of LNAs Through Ensemble Learning of On-Chip Digital Envelope Signatures Manuel J. BarragánRafaella FiorelliJosé L. Huertas OriginalPaper 06 January 2011 Pages: 277 - 288
RFID System On-line Testing Based on the Evaluation of the Tags Read-Error-Rate Gilles FritzVincent BeroulleDavid Hély OriginalPaper 29 December 2010 Pages: 267 - 276
Fault Diagnosis in Lab-on-Chip Using Digital Microfluidic Logic Gates Yang ZhaoKrishnendu Chakrabarty OriginalPaper 15 December 2010 Pages: 69 - 83
On-Chip Delay Measurement Based Response Analysis for Timing Characterization Ramyanshu DattaAntony SebastineJacob A. Abraham OriginalPaper 27 November 2010 Pages: 599 - 619
Masking of X-Values by Use of a Hierarchically Configurable Register Thomas RabenaltMichael GoesselAndreas Leininger OriginalPaper 17 November 2010 Pages: 31 - 41
A Framework for Automated Detection of Power-related Software Errors in Industrial Verification Processes Stefano GandiniWalter RuzzarinAlberto Tonda OriginalPaper 06 November 2010 Pages: 689 - 697
Study of Read Recovery Dynamic Faults in 6T SRAMS and Method to Improve Test Time Prashant DubeyAkhil GargShashank Mahajan OriginalPaper 06 November 2010 Pages: 659 - 666
Test Strategies for Electrode Degradation in Bio-Fluidic Microsystems Qais Al-GayemHongyuan LiuNick Burd OriginalPaper 05 November 2010 Pages: 57 - 68
