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Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse

  • Book
  • © 1969

Overview

Editors:
  1. G. Möllenstedt

    1. Institut für angewandte Physik der Universität, Tübingen, Germany

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  2. K. H. Gaukler

    1. Institut für angewandte Physik der Universität, Tübingen, Germany

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Table of contents (101 chapters)

  1. Instrumentation

    1. The TPD Electron Probe X-Ray Micro Analyzer

      • L. A. Fontijn, A. B. Bok, J. G. Kornet
      Pages 261-268

    2. New Spectrometers and Accessories for the Electron Microprobe

      • J. B. Nicholson, H. Neuhaus, M. F. Hasler
      Pages 269-273

    3. Geräte und Methoden zur quantitativen Gefügecharakterisierung mit der Mikrosonde

      • G. Dörfler, G. Reich
      Pages 274-277

    4. Der Vielkanalanalysator als Zusatzgerät zur Mikrosonde für die Spurenanalyse und die Analyse mit geringen Strömen

      • G. Dörfler, E. Plöckinger
      Pages 278-281

    5. Développement d’accessoires adaptables au microanalyseur à sonde électronique pour l’étude des inclusions

      • C. Conty, J.-M. Rouberol, M. Tong
      Pages 282-286

    6. Sélecteur de fréquences X pour le rayonnement synchrotron. Etude de la réflexion spéculaire entre 6 et 14Å

      • R. Barchewitz, M. Montel, C. Bonnelle
      Pages 287-292

    7. Microanalysis in the Transmission Electron Microscope by Selected Area Electron Spectrometry

      • D. B. Wittry, R. P. Ferrier, V. E. Cosslett
      Pages 293-298

    8. Microanalysis by Electron Energy Analysis with a Cylindrical Magnetic Lens

      • T. Ichinokawa, H. Tochigi
      Pages 299-304

    9. Effect of Electron Source to Energy Resolution in Electron Velocity Analysis — Interpretation of Boersch Effect

      • T. Ichinokawa
      Pages 305-310

    10. Microanalyseur par émission ionique secondaire

      • J.-M. Rouberol, J. Guernet, P. Deschamps, J.-P. Dagnot, J.-M. Guyon de la Berge
      Pages 311-318

    11. Microanalysis with a Proton-Probe

      • D. M. Poole, J. L. Shaw
      Pages 319-324

    12. Microanalyse d’une surface solide par iono-luminescence

      • J. P. Meriaux, R. Goutte, C. Guillaud
      Pages 325-328

    13. A High Resolution Electron Microscope for Conventional Imaging and Scanning Mode of Operation

      • P. S. Ong
      Pages 329-332

    14. Development of a Scanning Electron Mirror Microscope

      • D. M. Koffman, S. H. Moll, M. A. Schippert, R. E. Ogilvie
      Pages 333-336

    15. Computer Controlled Scanning Electron Microscope

      • R. E. Ogilvie, D. Yankovich, R. E. Warren, J. H. Laning, P. Reist, W. Burges
      Pages 337-340

    16. A New Scanning Electron Microscope

      • R. Buchanan, V. G. Macres, O. Preston, N. C. Yew
      Pages 341-342

    17. A Combined Scanning Electron Microscope/Electron Microprobe Analyzer

      • V. G. Macres, O. Preston, N. C. Yew, R. Buchanan
      Pages 343-344

    18. Photo Emission Electron Microscopy

      • L. Wegmann
      Pages 345-350

    19. Röntgenemissionsspektrometrie von Elementen niedriger Ordnungszahl (Z < 15)

      • W. Hink
      Pages 351-360

    20. The Detection of Light Elements

      • E. F. Priestley, H. K. Phelan
      Pages 361-364
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Keywords

Editors and Affiliations

  • Institut für angewandte Physik der Universität, Tübingen, Germany

    G. Möllenstedt, K. H. Gaukler

Bibliographic Information

  • Book Title: Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse

  • Editors: G. Möllenstedt, K. H. Gaukler

  • DOI: https://doi.org/10.1007/978-3-662-24778-5

  • Publisher: Springer Berlin, Heidelberg

  • eBook Packages: Springer Book Archive

  • Copyright Information: Springer-Verlag Berlin Heidelberg 1969

  • Softcover ISBN: 978-3-662-22845-6Published: 01 January 1969

  • eBook ISBN: 978-3-662-24778-5Published: 02 July 2013

  • Edition Number: 1

  • Number of Pages: XII, 612

  • Number of Illustrations: 687 b/w illustrations, 3 illustrations in colour

  • Topics: Quantum Optics

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