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X-Ray and Neutron Dynamical Diffraction

Theory and Applications

  • Book
  • © 1996

Overview

Editors:
  1. André Authier

    1. Université Pierre et Marie Curie, Paris, France

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  2. Stefano Lagomarsino

    1. Istituto Elettronica Stato Solido, CNR, Rome, Italy

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  3. Brian K. Tanner

    1. University of Durham, Durham, England

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Part of the book series: NATO Science Series B: (NSSB, volume 357)

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Table of contents (26 chapters)

  1. Theory and Applications of High Resolution Diffractometry

    1. Superlattices

      • Paul F. Fewster
      Pages 289-299

    2. Characterization of Lattice Defects in Ion-Implanted Silicon

      • Marco Servidori, Franco Cembali, Silvia Milita
      Pages 301-321

  3. X-Ray and Neutron Interferometry

    1. X-Ray and Neutron Interferometry: Basic Principles and Applications

      • R. Colella
      Pages 369-380

    2. Applications of X-Ray Interferometry

      • D. K. Bowen
      Pages 381-410

  4. Back Matter

    Pages 411-419
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Keywords

About this book

This volume collects the proceedings of the 23rd International Course of Crystallography, entitled "X-ray and Neutron Dynamical Diffraction, Theory and Applications," which took place in the fascinating setting of Erice in Sicily, Italy. It was run as a NATO Advanced Studies Institute with A. Authier (France) and S. Lagomarsino (Italy) as codirectors, and L. Riva di Sanseverino and P. Spadon (Italy) as local organizers, R. Colella (USA) and B. K. Tanner (UK) being the two other members of the organizing committee. It was attended by about one hundred participants from twenty four different countries. Two basic theories may be used to describe the diffraction of radiation by crystalline matter. The first one, the so-called geometrical, or kinematical theory, is approximate and is applicable to small, highly imperfect crystals. It is used for the determination of crystal structures and describes the diffraction of powders and polycrystalline materials. The other one, the so-called dynamical theory, is applicable to perfect or nearly perfect crystals. For that reason, dynamical diffraction of X-rays and neutrons constitutes the theoretical basis of a great variety of applications such as: • the techniques used for the characterization of nearly perfect high technology materials, semiconductors, piezoelectric, electrooptic, ferroelectric, magnetic crystals, • the X-ray optical devices used in all modem applications of Synchrotron Radiation (EXAFS, High Resolution X-ray Diffractometry, magnetic and nuclear resonant scattering, topography, etc. ), and • X-ray and neutron interferometry.

Editors and Affiliations

  • Université Pierre et Marie Curie, Paris, France

    André Authier

  • Istituto Elettronica Stato Solido, CNR, Rome, Italy

    Stefano Lagomarsino

  • University of Durham, Durham, England

    Brian K. Tanner

Bibliographic Information

  • Book Title: X-Ray and Neutron Dynamical Diffraction

  • Book Subtitle: Theory and Applications

  • Editors: André Authier, Stefano Lagomarsino, Brian K. Tanner

  • Series Title: NATO Science Series B:

  • DOI: https://doi.org/10.1007/978-1-4615-5879-8

  • Publisher: Springer New York, NY

  • eBook Packages: Springer Book Archive

  • Copyright Information: Springer Science+Business Media New York 1996

  • Softcover ISBN: 978-1-4613-7696-5Published: 24 October 2012

  • eBook ISBN: 978-1-4615-5879-8Published: 06 December 2012

  • Series ISSN: 0258-1221

  • Edition Number: 1

  • Number of Pages: IX, 419

  • Topics: Solid State Physics, Spectroscopy and Microscopy, Characterization and Evaluation of Materials

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