Fundamental Materials Research

From Semiconductors to Proteins: Beyond the Average Structure

Editors: Billinge, simon, Thorpe, M.F. (Eds.)

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About this book

This series of books, which is published at the rate of about one per year, addresses fundamental problems in materials science. The contents cover a broad range of topics from small clusters of atoms to engineering materials and involve chemistry, physics, materials science, and engineering, with length scales ranging from Angstroms up to millimeters. The emphasis is on basic science rather than on applications. Each book focuses on a single area of current interest and brings together leading experts to give an up-to-date discussion of their work and the work of others. Each article contains enough references that the interested reader can access the relevant literature. Thanks are given to the Center for Fundamental Materials Research at Michigan State University for supporting this series. M.F. Thorpe, Series Editor E-mail: thorpe@pa.msu.edu East Lansing, Michigan, November 200 I v PREFACE The study of the atomic structure of crystalline materials began at the beginning of the twentieth century with the discovery by Max von Laue and by W.H. and W.L. Bragg that crystals diffract x-rays. At that time, even the existence of atoms was controversial.

Table of contents (15 chapters)

  • Analysis of Single-Crystal Diffuse X-Ray Scattering via Automatic Refinement of a Monte Carlo Model

    Welberry, T. R.

    Pages 1-22

  • Medium-Range Atomic Correlation from the PDF Analysis

    Egami, T.

    Pages 23-32

  • X-Ray Truncation Rod Analysis of the Reversible Temperature Dependent Surface Structure of LAALO3

    Francis, R. J. (et al.)

    Pages 33-47

  • Local Dislocation Structure from Laue Diffraction

    Barabash, R. I. (et al.)

    Pages 49-66

  • Processes of Self-Organization during Epitaxial Growth of Semiconductor Superlattices — An X-Ray Scattering Study

    Holý, Václav (et al.)

    Pages 67-83

Buy this book

eBook $199.00
price for USA (gross)
  • ISBN 978-1-4615-0613-3
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $319.00
price for USA
  • ISBN 978-0-306-47239-8
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $259.00
price for USA
  • ISBN 978-1-4613-5158-0
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
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Bibliographic Information

Bibliographic Information
Book Title
From Semiconductors to Proteins: Beyond the Average Structure
Editors
  • simon Billinge
  • M.F. Thorpe
Series Title
Fundamental Materials Research
Copyright
2002
Publisher
Springer US
Copyright Holder
Springer Science+Business Media New York
eBook ISBN
978-1-4615-0613-3
DOI
10.1007/978-1-4615-0613-3
Hardcover ISBN
978-0-306-47239-8
Softcover ISBN
978-1-4613-5158-0
Series ISSN
1567-830X
Edition Number
1
Number of Pages
X, 287
Topics