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Picosecond Electronics and Optoelectronics II

Proceedings of the Second OSA-IEEE (LEOS) Incline Village, Nevada, January 14–16, 1987

  • Conference proceedings
  • © 1987

Overview

Editors:
  1. Frederick John Leonberger

    1. United Technologies Research Center, East Hartford, USA

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  2. Chi H. Lee

    1. Dept. of Electrical Engineering, University of Maryland, College Park, USA

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  3. Federico Capasso

    1. AT&T Bell Laboratories, Murray Hill, USA

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  4. Hadis Morkoc

    1. Dept. of Electrical Engineering, University of Illinois, Champaign Urbana, USA

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Part of the book series: Springer Series in Electronics and Photonics (SSEP, volume 24)

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Table of contents (62 papers)

  1. Front Matter

    Pages I-XII
    Download chapter PDF

  2. Introduction

    1. Introduction

      • F. J. Leonberger, C. H. Lee, F. Capasso, H. Morkoc
      Pages 1-2

  3. High-Speed Probing Techniques

    1. Front Matter

      Pages 3-3
      Download chapter PDF

    2. A Non-contact Electro-optic Prober for High Speed Integrated Circuits

      • J. A. Valdmanis, S. S. Pei
      Pages 4-10

    3. Photoconductive Generation of Subpicosecond Electrical Pulses and Their Measurement Applications

      • D. Grischkowsky, C.-C. Chi, I. N. Duling III, W. J. Gallagher, N. H. Halas, J.-M. Halbout et al.
      Pages 11-17

    4. Picosecond Sampling of GaAs Integrated Circuits

      • K. J. Weingarten, M. J. W. Rodwell, D. M. Bloom
      Pages 18-24

    5. Electro-optic Sampling of High-Speed, InP-Based Integrated Circuits

      • J. M. Wiesenfeld, R. S. Tucker, A. Antreasyan, C. A. Burrus, A. J. Taylor
      Pages 25-28

    6. Electro-optic Sampling Analysis of Timing Patterns at Critical Internal Nodes in Gigabit GaAs Multiplexers/Demultiplexers

      • X.-C. Zhang, R. K. Jain, R. Hickling
      Pages 29-32

    7. A Technique for Wing Suppressed IR Sampling

      • J. Nees, S. Williamson
      Pages 33-35

    8. Picosecond Electrical Pulse for VLSI Electronics Characterization

      • J.-M. Halbout, P. G. May, M. B. Ketchen, H. Jackel, G. P. Li, C.-C. Chi et al.
      Pages 36-39

    9. Ultrafast Optics Applied to Modern Device Research

      • G. Mourou, K. Meyer, J. Whitaker, M. Pessot, R. Grondin, C. Caruso
      Pages 40-48

    10. An Optically Strobed Sample and Hold Circuit

      • C. McConaghy
      Pages 49-52

    11. Laser Pulsed E-Beam System for High Speed I.C. Testing

      • P. May, J.-M Halbout, G. Chiu
      Pages 53-55

    12. Photoemissive Testing of High-Speed Electrical Waveforms

      • A. M. Weiner, P. S. D. Lin, R. B. Marcus
      Pages 56-60

    13. High-Speed Optical Logic Using GaAs

      • H. M. Gibbs, N. Peyghambarian, Y. H. Lee, J. L. Jewell, A. Migus, A. Antonetti et al.
      Pages 61-63

    14. Comparison of Sampling Oscilloscopes with ∼35 ps Transition Durations

      • J. R. Andrews
      Pages 64-66

    15. Picosecond Optoelectronic Study of a Thin Film Transmission Line Structure

      • G. Arjavalingam, J.-M. Halbout, G. V. Kopcsay, M. B. Ketchen
      Pages 67-70
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Keywords

About this book

Over the past five years, there has been an enormous increase in the inter­ est in and understanding of electronic and optoelectronic devices operating in the picosecond (multigigahertz) range. This has been fueled in a sig­ nificant way by the spectacular advances in picosecond laser technology, electro optic sampling, III-V devices, and wideband fiber optic systems. Partly to address these advances, a new conference jointly sponsored by the IEEE Lasers and Electrooptics Society (IEEE (LEOS)) and the Op­ tical Society of America (OSA) was founded and its first meeting held in March 1985. The purpose of this meeting was to bring together work­ ers in the areas of electronics and optoelectronics who share a common interest in the physics and technology of picosecond solid-state electronic and optoelectronic devices, their multigigahertz applications, and ultrafast measurement techniques. Emphasis was placed on the interdisciplinary as­ pects of these areas, since each area is covered by its own topical meeting. This meeting was quite successful and led to a second meeting, of which this volume forms the proceedings.

Editors and Affiliations

  • United Technologies Research Center, East Hartford, USA

    Frederick John Leonberger

  • Dept. of Electrical Engineering, University of Maryland, College Park, USA

    Chi H. Lee

  • AT&T Bell Laboratories, Murray Hill, USA

    Federico Capasso

  • Dept. of Electrical Engineering, University of Illinois, Champaign Urbana, USA

    Hadis Morkoc

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