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Work Function and Band Alignment of Electrode Materials

The Art of Interface Potential for Electronic Devices, Solar Cells, and Batteries

  • Book
  • © 2021

Overview

  • Describes the factors that determine work function values from the physics point of view
  • Provides ways of controlling work function systematically
  • Presents systematic methods of modifying band alignment

Part of the book series: NIMS Monographs (NIMSM)

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Table of contents (8 chapters)

Keywords

About this book

This book covers a wide range of topics on work function and band alignment, from the basics to practical examples. Work function and band alignment determine electric properties at the interface including surfaces, such as electron emission, the Schottky barrier height, and ohmic contact. Basic physics is used to systematically explain how to adjust and measure work function and how to modify the band alignment required for controlling work function in functional materials and electrodes. Methods introduced in the book help to improve device performance and to solve the problems of controlling the voltage and efficiency of devices in a great variety of applications, including electronic devices, optical devices such as displays, and energy devices such as solar cells and batteries. Understanding the technical methods necessary for controlling work function and band alignment can help to solve problems such as non-ohmic contact at source–electrode or drain–electrode interfaces in metal–oxide–silicon structures, which directly contributes to improving power saving and reducing heat generation in computers.

Authors and Affiliations

  • National Institute for Materials Science, Tsukuba, Japan

    Michiko Yoshitake

About the author

Dr. Michiko Yoshitake has worked on surfaces and thin films using ultrahigh vacuum instruments for more than 30 years. Her main focus has been the establishment of various prediction methods of either phenomena or material properties rather than the development of materials. She also has long experience in surface analysis, especially in X-ray photoelectron spectroscopy.

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