Overview
- Reviews by leading experts in SOI nanoscaled electronics
- Analysis of prospects of SOI nanoelectronics beyond Moore’s law
- Explanation of fundamental limits for CMOS, SOICMOS and single electron technologies
- Combined views on SOI nanoscaled electronics from experts in the fields of materials science, device physics, electrical characterization and computer simulation
Part of the book series: NATO Science for Peace and Security Series B: Physics and Biophysics (NAPSB)
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Keywords
Table of contents (24 papers)
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Reliability and Characterization of Nanoscaled SOI Devices
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Theory and Modeling of Nanoscaled Devices
Editors and Affiliations
Bibliographic Information
Book Title: Nanoscaled Semiconductor-on-Insulator Structures and Devices
Editors: Steve Hall, Alexei N. Nazarov, Vladimir S. Lysenko
Series Title: NATO Science for Peace and Security Series B: Physics and Biophysics
DOI: https://doi.org/10.1007/978-1-4020-6380-0
Publisher: Springer Dordrecht
eBook Packages: Chemistry and Materials Science, Chemistry and Material Science (R0)
Copyright Information: Springer Science+Business Media B.V. 2007
Hardcover ISBN: 978-1-4020-6378-7Published: 09 July 2007
Softcover ISBN: 978-1-4020-6379-4Published: 06 July 2007
eBook ISBN: 978-1-4020-6380-0Published: 04 September 2007
Series ISSN: 1874-6500
Series E-ISSN: 1874-6535
Edition Number: 1
Number of Pages: XIII, 369
Topics: Optical and Electronic Materials, Nanotechnology, Electrical Engineering, Electronics and Microelectronics, Instrumentation