Overview
- Highlights the use of materials with atomically thin layers in electronics and optoelectronic devices
- Discusses the thermal performance of materials such as graphene and transition metal dichalcogenides
- Introduces readers to novel techniques for thermal measurement based on the photothermal effects
Part of the book series: SpringerBriefs in Applied Sciences and Technology (BRIEFSAPPLSCIENCES)
Part of the book sub series: Nanoscience and Nanotechnology (BRIEFSNANOSCIENCE)
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Table of contents (3 chapters)
Keywords
About this book
This book assesses the thermal feasibility of using materials with atomically thin layers such as graphene and the transition metal dichalcogenides family in electronics and optoelectronics applications. The focus is on thermal conductivity measurement techniques currently available for the investigation of thermal performance at the material and device level. In addition to providing detailed information on the available techniques, the book introduces readers to novel techniques based on photothermal effects.
Authors and Affiliations
About the author
Bibliographic Information
Book Title: Thermal Conductivity Measurements in Atomically Thin Materials and Devices
Authors: T. Serkan Kasirga
Series Title: SpringerBriefs in Applied Sciences and Technology
DOI: https://doi.org/10.1007/978-981-15-5348-6
Publisher: Springer Singapore
eBook Packages: Engineering, Engineering (R0)
Copyright Information: The Author(s), under exclusive license to Springer Nature Singapore Pte Ltd. 2020
Softcover ISBN: 978-981-15-5347-9Published: 20 May 2020
eBook ISBN: 978-981-15-5348-6Published: 19 May 2020
Series ISSN: 2191-530X
Series E-ISSN: 2191-5318
Edition Number: 1
Number of Pages: XV, 50
Number of Illustrations: 3 b/w illustrations, 21 illustrations in colour
Topics: Nanoscale Science and Technology, Optical and Electronic Materials, Engineering Thermodynamics, Heat and Mass Transfer, Surface and Interface Science, Thin Films, Solid State Physics, Surfaces and Interfaces, Thin Films