Springer Book Archives: eBooks only 8.99 each! Save now >>

Lecture Notes in Electrical Engineering

Novel Algorithms for Fast Statistical Analysis of Scaled Circuits

Authors: Singhee, Amith, Rutenbar, Rob A.

Free Preview
  • Presents flexible and general techniques for statistical analysis that can be applied to a wide variety of circuit applications
  • Applies theory from a wide variety of scientific fields such as machine learning, computational finance, number theory and actuarial studies
  • Covers relevant theory in detail
  • This is the first book to present these novel techniques
  • Contains extensive experiments, illustrative examples and detailed analysis
  • Includes fifty figures
see more benefits

Buy this book

eBook $139.00
price for USA in USD (gross)
  • ISBN 978-90-481-3100-6
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $179.99
price for USA in USD
  • ISBN 978-90-481-3099-3
  • Free shipping for individuals worldwide
  • Immediate ebook access, if available*, with your print order
  • Usually dispatched within 3 to 5 business days.
Softcover $179.99
price for USA in USD
  • ISBN 978-94-007-3687-0
  • Free shipping for individuals worldwide
  • Immediate ebook access, if available*, with your print order
  • Usually dispatched within 3 to 5 business days.
About this book

As VLSI technology moves to the nanometer scale for transistor feature sizes, the impact of manufacturing imperfections result in large variations in the circuit performance. Traditional CAD tools are not well-equipped to handle this scenario, since they do not model this statistical nature of the circuit parameters and performances, or if they do, the existing techniques tend to be over-simplified or intractably slow. Novel Algorithms for Fast Statistical Analysis of Scaled Circuits draws upon ideas for attacking parallel problems in other technical fields, such as computational finance, machine learning and actuarial risk, and synthesizes them with innovative attacks for the problem domain of integrated circuits. The result is a set of novel solutions to problems of efficient statistical analysis of circuits in the nanometer regime. In particular, Novel Algorithms for Fast Statistical Analysis of Scaled Circuits makes three contributions:

1) SiLVR, a nonlinear response surface modeling and performance-driven dimensionality reduction strategy, that automatically captures the designer’s insight into the circuit behavior, by extracting quantitative measures of relative global sensitivities and nonlinear correlation.

2) Fast Monte Carlo simulation of circuits using quasi-Monte Carlo, showing speedups of 2× to 50× over standard Monte Carlo.

3) Statistical blockade, an efficient method for sampling rare events and estimating their probability distribution using limit results from extreme value theory, applied to high replication circuits like SRAM cells.

Reviews

The Statistical Blockade method proposed by Singhee and Rutenbar will make a significant impact on the design of next-generation digital integrated circuits. It has the potential to dramatically reduce simulation time compared to a traditional Monte Carlo approach. Their award winning work is well received by industry and has influenced research directions in academia.
- Prof. Anantha Chandrakasan, MIT


Table of contents (4 chapters)

Table of contents (4 chapters)

Buy this book

eBook $139.00
price for USA in USD (gross)
  • ISBN 978-90-481-3100-6
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $179.99
price for USA in USD
  • ISBN 978-90-481-3099-3
  • Free shipping for individuals worldwide
  • Immediate ebook access, if available*, with your print order
  • Usually dispatched within 3 to 5 business days.
Softcover $179.99
price for USA in USD
  • ISBN 978-94-007-3687-0
  • Free shipping for individuals worldwide
  • Immediate ebook access, if available*, with your print order
  • Usually dispatched within 3 to 5 business days.
Loading...

Recommended for you

Loading...

Bibliographic Information

Bibliographic Information
Book Title
Novel Algorithms for Fast Statistical Analysis of Scaled Circuits
Authors
Series Title
Lecture Notes in Electrical Engineering
Series Volume
46
Copyright
2009
Publisher
Springer Netherlands
Copyright Holder
Springer Science+Business Media B.V.
eBook ISBN
978-90-481-3100-6
DOI
10.1007/978-90-481-3100-6
Hardcover ISBN
978-90-481-3099-3
Softcover ISBN
978-94-007-3687-0
Series ISSN
1876-1100
Edition Number
1
Number of Pages
XV, 195
Topics

*immediately available upon purchase as print book shipments may be delayed due to the COVID-19 crisis. ebook access is temporary and does not include ownership of the ebook. Only valid for books with an ebook version. Springer Reference Works are not included.