Overview
- Provides basics and developments of the spin-resolved photoemission spectrometer that has achieved the highest energy resolution level worldwide
- Shows the sample preparation method for high-quality ultra-thin films
- Reports on the anisotropic Rashba effect of Bi and the Rashba effect at the interface between semiconductor and metal
- Nominated as an outstanding contribution by Tohoku University's Physics Department in 2013
- Includes supplementary material: sn.pub/extras
Part of the book series: Springer Theses (Springer Theses)
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Table of contents (6 chapters)
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Front Matter
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Back Matter
Keywords
About this book
In this thesis, the author has developed a high-resolution spin-resolved photoemission spectrometer that achieves the world-best energy resolution of 8 meV. The author has designed a new, highly efficient mini Mott detector that has a large electron acceptance angle and an atomically flat gold target to enhance the efficiency of detecting scattered electrons.
The author measured the electron and spin structure of Bi thin film grown on a Si(111) surface to study the Rashba effect. Unlike the conventional Rashba splitting, an asymmetric in-plane spin polarization and a tremendous out-of-plane spin component were observed. Moreover, the author found that the spin polarization of Rashba surface states is reduced by decreasing the film thickness, which indicates the considerable interaction of Rashba spin-split states between the surface and Bi/Si interface.
Authors and Affiliations
About the author
Bibliographic Information
Book Title: High-Resolution Spin-Resolved Photoemission Spectrometer and the Rashba Effect in Bismuth Thin Films
Authors: Akari Takayama
Series Title: Springer Theses
DOI: https://doi.org/10.1007/978-4-431-55028-0
Publisher: Springer Tokyo
eBook Packages: Physics and Astronomy, Physics and Astronomy (R0)
Copyright Information: Springer Japan 2015
Hardcover ISBN: 978-4-431-55027-3Published: 30 September 2014
Softcover ISBN: 978-4-431-56372-3Published: 22 September 2016
eBook ISBN: 978-4-431-55028-0Published: 20 September 2014
Series ISSN: 2190-5053
Series E-ISSN: 2190-5061
Edition Number: 1
Number of Pages: XII, 83
Number of Illustrations: 54 b/w illustrations, 5 illustrations in colour
Topics: Surface and Interface Science, Thin Films, Spectroscopy and Microscopy, Surfaces and Interfaces, Thin Films, Measurement Science and Instrumentation, Semiconductors