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Ellipsometry of Functional Organic Surfaces and Films

  • Book
  • © 2014

Overview

Editors:
  1. Karsten Hinrichs

    1. Leibniz Institute for Analytical Sciences - ISAS - e. V., Berlin, Germany

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  2. Klaus-Jochen Eichhorn

    1. Leibniz Institute of Polymer Research Analytics, Dresden, Germany

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    You can also search for this editor in PubMed   Google Scholar

  • Provides a state of the art report of the technique of ellipsometry
  • Presents recent developments in ellipsometric real-time/in-situ monitoring techniques
  • Is oriented towards the high technological interest in the characterization of functional organic films and surfaces
  • Includes the collection of optical constants
  • Written by leading scientists
  • Includes supplementary material: sn.pub/extras

Part of the book series: Springer Series in Surface Sciences (SSSUR, volume 52)

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Table of contents (18 chapters)

  1. Front Matter

    Pages I-XXI
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  2. Ellipsometry: A Survey of Concept

    • Christoph Cobet
    Pages 1-26

  3. Biomolecules at Surfaces

    1. Front Matter

      Pages 27-27
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    2. Adsorption of Proteins at Solid Surfaces

      • Hans Arwin
      Pages 29-46

    3. DNA Structures on Silicon and Diamond

      • Simona D. Pop, Karsten Hinrichs, Sylvia Wenmackers, Christoph Cobet, Norbert Esser, Dietrich R. T. Zahn
      Pages 47-59

  4. Smart Polymer Surfaces and Films

    1. Front Matter

      Pages 61-61
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    2. Glass Transition of Polymers with Different Architectures in the Confinement of Nanoscopic Films

      • Michael Erber, Martin Tress, Klaus-Jochen Eichhorn
      Pages 63-78

    3. Polymer Brushes, Hydrogels, Polyelectrolyte Multilayers: Stimuli-Responsivity and Control of Protein Adsorption

      • Eva Bittrich, Petra Uhlmann, Klaus-Jochen Eichhorn, Karsten Hinrichs, Dennis Aulich, Andreas Furchner
      Pages 79-105

  5. Nanostructured Surfaces and Organic/Inorganic Hybrids

    1. Front Matter

      Pages 107-107
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    2. Systems of Nanoparticles with SAMs and Polymers

      • Thomas W. H. Oates
      Pages 109-133

    3. Detection of Organic Attachment onto Highly Ordered Three-Dimensional Nanostructure Thin Films by Generalized Ellipsometry and Quartz Crystal Microbalance with Dissipation Techniques

      • Keith B. Rodenhausen, Daniel Schmidt, Charles Rice, Tino Hofmann, Eva Schubert, Mathias Schubert
      Pages 135-154

    4. Polarizing Natural Nanostructures

      • Kenneth Järrendahl, Hans Arwin
      Pages 155-169

  6. Thin Films of Organic Semiconductors for OPV, OLEDs and OTFT

    1. Front Matter

      Pages 171-171
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    2. Polymer Blends and Composites

      • Stergios Logothetidis
      Pages 173-195

    3. Small Organic Molecules

      • Ovidiu D. Gordan, Dietrich R. T. Zahn
      Pages 197-219

  7. Developments in Ellipsometric Real-Time/In-situ Monitoring Techniques

    1. Front Matter

      Pages 221-221
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    2. Coupling Spectroscopic Ellipsometry and Quartz Crystal Microbalance to Study Organic Films at the Solid-Liquid Interface

      • Ralf P. Richter, Keith B. Rodenhausen, Nico B. Eisele, Mathias Schubert
      Pages 223-248

    3. TIRE and SPR-Enhanced SE for Adsorption Processes

      • Hans Arwin
      Pages 249-264

    4. In-line Quality Control of Organic Thin Film Fabrication on Rigid and Flexible Substrates

      • Agiris Laskarakis, Stergios Logothetidis
      Pages 265-286

    5. Application of In-situ IR-Ellipsometry in Electrochemistry to Study Ultra-Thin Films

      • Jörg Rappich, Karsten Hinrichs, Guoguang Sun, Xin Zhang
      Pages 287-302
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Keywords

About this book

Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. In conjunction with the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices and fabrication advances, the ellipsometric analysis of their optical and material properties has progressed rapidly in the recent years.

Editors and Affiliations

  • Leibniz Institute for Analytical Sciences - ISAS - e. V., Berlin, Germany

    Karsten Hinrichs

  • Leibniz Institute of Polymer Research Analytics, Dresden, Germany

    Klaus-Jochen Eichhorn

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