Authors:
- Presents the state-of-the-art in scanning probe techniques
- Combines basic physical principles and their application to scanning tunneling and atomic force microscopes
- Useful study text for graduate students and also useful reference to researchers
- Includes supplementary material: sn.pub/extras
Part of the book series: NanoScience and Technology (NANO)
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Table of contents (24 chapters)
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Front Matter
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Scanning Probe Microscopy Instrumentation
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Front Matter
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Atomic Force Microscopy (AFM)
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Front Matter
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About this book
This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.
Reviews
“The book attempts to provide a technical, theoretical, and conceptual framework to understand how SPM works and what can be done with it so that a reader wishing to further learn about newer topics will have the basis to do so. This book could thus serve as a useful reference and textbook for anyone desiring an advanced introduction to the fascinating world of SPM.” (Sidney Cohen, MRS Bulletin, Vol. 41, February, 2016)
“The contents of this book are presented in a very clear didactic manner ... . In addition, it includes the foundations of many technical aspects that are not necessarily a part of the methods themselves, but which in practice are required for the application. ... What I particularly like, is the fact that it discusses common artefacts occurring in scanning tunneling microscopy. Such discussions are rare in the literature, although they are essential for a complete training of young scientists. To my mind the book is well suited not only for physicists, but also for chemists, materials and nano-scientists and others with similar background.” (Quote translated from German, Jascha Repp, Physik Journal, issue 4, 2016)
Authors and Affiliations
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Forschungszentrum Jülich, Peter Grünberg Institut (PGI-3) and RWTH—Aachen University, Lehrstuhl für Experimentalphysik IVA, Aachen, Germany, Jülich, Germany
Bert Voigtländer
About the author
This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.
Bibliographic Information
Book Title: Scanning Probe Microscopy
Book Subtitle: Atomic Force Microscopy and Scanning Tunneling Microscopy
Authors: Bert Voigtländer
Series Title: NanoScience and Technology
DOI: https://doi.org/10.1007/978-3-662-45240-0
Publisher: Springer Berlin, Heidelberg
eBook Packages: Chemistry and Materials Science, Chemistry and Material Science (R0)
Copyright Information: Springer-Verlag Berlin Heidelberg 2015
Hardcover ISBN: 978-3-662-45239-4Published: 23 March 2015
Softcover ISBN: 978-3-662-50557-1Published: 13 October 2016
eBook ISBN: 978-3-662-45240-0Published: 24 February 2015
Series ISSN: 1434-4904
Series E-ISSN: 2197-7127
Edition Number: 1
Number of Pages: XV, 382
Number of Illustrations: 41 b/w illustrations, 148 illustrations in colour
Topics: Nanotechnology, Nanotechnology and Microengineering, Condensed Matter Physics