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Springer Tracts in Modern Physics

Applied RHEED

Reflection High-Energy Electron Diffraction During Crystal Growth

Authors: Braun, Wolfgang

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  • Up-to-date review of the state of the art
  • Important methods for surface and semiconductor physics
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eBook $84.99
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  • ISBN 978-3-540-49485-0
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About this book

The book describes RHEED (reflection high-energy electron diffraction) used as a tool for crystal growth. New methods using RHEED to characterize surfaces and interfaces during crystal growth by MBE (molecular beam epitaxy) are presented. Special emphasis is put on RHEED intensity oscillations, segregation phenomena, electron energy-loss spectroscopy and RHEED with rotating substrates.

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Anyone interested in L.-M. Peng's chapter on RHEED will want to know that an entire volume on the subject has been written by W. Braun (9). This is a substantial work, full of practical detail...
Ultramicroscopy, 2001/87

Table of contents (11 chapters)

Table of contents (11 chapters)

Buy this book

eBook $84.99
price for USA in USD (gross)
  • The eBook version of this title will be available soon
  • ISBN 978-3-540-49485-0
  • Digitally watermarked, DRM-free
  • Included format:
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Softcover $109.99
price for USA in USD
  • ISBN 978-3-662-15614-8
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
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Bibliographic Information

Bibliographic Information
Book Title
Applied RHEED
Book Subtitle
Reflection High-Energy Electron Diffraction During Crystal Growth
Authors
Series Title
Springer Tracts in Modern Physics
Series Volume
154
Copyright
1999
Publisher
Springer-Verlag Berlin Heidelberg
Copyright Holder
Springer-Verlag Berlin Heidelberg
eBook ISBN
978-3-540-49485-0
DOI
10.1007/BFb0109548
Softcover ISBN
978-3-662-15614-8
Series ISSN
0081-3869
Edition Number
1
Number of Pages
IX, 220
Number of Illustrations
169 b/w illustrations, 11 illustrations in colour
Topics