Springer Tracts in Modern Physics

Transmission Electron Microscopy of Semiconductor Nanostructures

An Analysis of Composition and Strain State

Authors: Rosenauer, Andreas

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  • Covers fundamentals and current topics of TEM
  • Highly important technology for future production of nanostructures
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About this book

This book provides tools well suited for the
quantitative investigation of semiconductor electron microscopy. These tools allow for the accurate determination of the composition of ternary semiconductor
nanostructures with a spatial resolution at near atomic scales. The book
focuses on new methods including strain state
analysis as well as evaluation of the composition
via the lattice fringe analysis (CELFA) technique.
The basics of these procedures as well as their
advantages, drawbacks and sources of error are all
discussed.  The techniques are applied to quantum
wells and dots in order to give insight into
kinetic growth effects such as segregation and
migration.

In the first part of the book the fundamentals of
transmission electron microscopy are provided.
These are needed for an understanding of the
digital image analysis techniques described in the
second part of the book.  There the reader will
find information on different methods of
composition determination.  The third part of the
book focuses on applications such as composition
determination in InGaAs Stranski--Krastanov
quantum dots.  Finally it is shown how an
improvement in the precision of the composition
evaluation can be obtained by combining CELFA with
electron holography.  This is demonstrated for an
AlAs/GaAs superlattice.

Table of contents (10 chapters)

Table of contents (10 chapters)

Buy this book

eBook $84.99
price for USA in USD
  • ISBN 978-3-540-36407-8
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Softcover $109.99
price for USA in USD
  • ISBN 978-3-662-14618-7
  • Free shipping for individuals worldwide
  • Institutional customers should get in touch with their account manager
  • Covid-19 shipping restrictions
  • Usually ready to be dispatched within 3 to 5 business days, if in stock
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Bibliographic Information

Bibliographic Information
Book Title
Transmission Electron Microscopy of Semiconductor Nanostructures
Book Subtitle
An Analysis of Composition and Strain State
Authors
Series Title
Springer Tracts in Modern Physics
Series Volume
182
Copyright
2003
Publisher
Springer-Verlag Berlin Heidelberg
Copyright Holder
Springer-Verlag Berlin Heidelberg
eBook ISBN
978-3-540-36407-8
DOI
10.1007/3-540-36407-2
Softcover ISBN
978-3-662-14618-7
Series ISSN
0081-3869
Edition Number
1
Number of Pages
XII, 241
Number of Illustrations
186 b/w illustrations, 47 illustrations in colour
Topics