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Competing Interactions and Microstructures: Statics and Dynamics

Proceedings of the CMS Workshop, Los Alamos, New Mexico, May 5–8, 1987

  • Conference proceedings
  • © 1988

Overview

Part of the book series: Springer Proceedings in Physics (SPPHY, volume 27)

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Table of contents (26 papers)

  1. Statics

Keywords

About this book

Many macroscopic properties of materials are determined primarily by inhomogeneous structures and textures. These intermediate-scale structures often arise from competing interactions operating on different length scales within the material. Our understanding of such phenomena has increased substantially with the identification and theoretical description of solid-state materials with incommensurate and long-period modulated phases, such as ferroelectrics, charge-density-wave compounds, epitaxial layers and polytypes. Experimental diagnosis of inhomogeneous ground states and metastable phases has advanced so far that these are now well-accepted phenomena. These proceedings bring together the work of physicists and materials scientists to review developments in this area and to examine possible future directions, such as how the microscopic understanding emerging in bench-top solid-state systems can be applied in materials science.

Editors and Affiliations

  • Los Alamos National Laboratory, Los Alamos, USA

    Richard LeSar, Alan Bishop, Robert Heffner

Bibliographic Information

  • Book Title: Competing Interactions and Microstructures: Statics and Dynamics

  • Book Subtitle: Proceedings of the CMS Workshop, Los Alamos, New Mexico, May 5–8, 1987

  • Editors: Richard LeSar, Alan Bishop, Robert Heffner

  • Series Title: Springer Proceedings in Physics

  • DOI: https://doi.org/10.1007/978-3-642-73498-4

  • Publisher: Springer Berlin, Heidelberg

  • eBook Packages: Springer Book Archive

  • Copyright Information: Springer-Verlag Berlin Heidelberg 1988

  • Softcover ISBN: 978-3-642-73500-4Published: 06 December 2011

  • eBook ISBN: 978-3-642-73498-4Published: 06 December 2012

  • Series ISSN: 0930-8989

  • Series E-ISSN: 1867-4941

  • Edition Number: 1

  • Number of Pages: VIII, 275

  • Topics: Crystallography and Scattering Methods, Surfaces and Interfaces, Thin Films

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