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X-Ray Microscopy and Spectromicroscopy

Status Report from the Fifth International Conference, Würzburg, August 19–23, 1996

Editors: Thieme, J., Schmahl, G., Rudolph, D., Umbach, E. (Eds.)

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  • This book is a status report on the newly developed technique of X-ray microscopy

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  • ISBN 978-3-642-72106-9
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About this book

This book contains state-of-the-art reviews and up-to-date progress reports in the field of X-ray microscopy and spectromicroscopy, including related new X-ray optics and X-ray sources. It reflects the lively activities in a relatively new field of science which combines the development of new instruments and methods with their applications to numerous topical scientific questions. The applications range from biological and medical topics, colloid physics, and soil sciences to solid-state physics, material sciences, and surface sciences. The book appeals to researchers who are active in microscopic and spectromicroscopic studies.

Table of contents (38 chapters)

Table of contents (38 chapters)

Buy this book

eBook $89.00
price for USA in USD
  • ISBN 978-3-642-72106-9
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Softcover $119.99
price for USA in USD
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Bibliographic Information

Bibliographic Information
Book Title
X-Ray Microscopy and Spectromicroscopy
Book Subtitle
Status Report from the Fifth International Conference, Würzburg, August 19–23, 1996
Editors
  • Jürgen Thieme
  • Günter Schmahl
  • Dietbert Rudolph
  • Eberhard Umbach
Copyright
1998
Publisher
Springer-Verlag Berlin Heidelberg
Copyright Holder
Springer-Verlag Berlin Heidelberg
eBook ISBN
978-3-642-72106-9
DOI
10.1007/978-3-642-72106-9
Softcover ISBN
978-3-642-72108-3
Edition Number
1
Number of Pages
XIX, 383
Number of Illustrations
400 b/w illustrations
Topics