Communications in Computer and Information Science

VLSI Design and Test

17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings

Editors: Gaur, S.M., Zwolinski, M., Laxmi, V., Boolchandani, D., Sing, V., Singh, A. (Eds.)

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  • 17th International Symposium on VLSI Design and Test, VDAT 2013

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About this book

This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.

Table of contents (44 chapters)

Table of contents (44 chapters)
  • Process Aware Ultra-High-Speed Hybrid Sensing Technique for Low Power Near-Threshold SRAM

    Pages 1-9

    Reniwal, Bhupendra Singh (et al.)

  • A Novel Design Methodology for High Tuning Linearity and Wide Tuning Range Ring Voltage Controlled Oscillator

    Pages 10-18

    Rajahari, Gudlavalleti (et al.)

  • A Low-Power Wideband High Dynamic Range Single-Stage Variable Gain Amplifier

    Pages 19-25

    Verma, Vivek (et al.)

  • An Ultra-Wideband Baseband Transmitter Design for Wireless Body Area Network

    Pages 26-34

    Mahesh, R. K. Naga (et al.)

  • Computational Functions’ VLSI Implementation for Compressed Sensing

    Pages 35-43

    Korde, Shrirang (et al.)

Buy this book

eBook $59.99
price for USA in USD
  • ISBN 978-3-642-42024-5
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Softcover $79.99
price for USA in USD
  • ISBN 978-3-642-42023-8
  • Free shipping for individuals worldwide
  • Institutional customers should get in touch with their account manager
  • Covid-19 shipping restrictions
  • Usually ready to be dispatched within 3 to 5 business days, if in stock
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Bibliographic Information

Bibliographic Information
Book Title
VLSI Design and Test
Book Subtitle
17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings
Editors
  • Singh Manoj Gaur
  • Mark Zwolinski
  • Vijay Laxmi
  • D. Boolchandani
  • Virendra Sing
  • Adit Singh
Series Title
Communications in Computer and Information Science
Series Volume
382
Copyright
2013
Publisher
Springer-Verlag Berlin Heidelberg
Copyright Holder
Springer-Verlag Berlin Heidelberg
eBook ISBN
978-3-642-42024-5
DOI
10.1007/978-3-642-42024-5
Softcover ISBN
978-3-642-42023-8
Series ISSN
1865-0929
Edition Number
1
Number of Pages
XVI, 388
Number of Illustrations
246 b/w illustrations
Topics