Ellipsometry at the Nanoscale

Editors: Losurdo, Maria, Hingerl, Kurt (Eds.)

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  • Provides different aspects and opinion on a rapidly evolving field
  • Reviews recent applications of polarimetric techniques to nanomaterials
  • Written by renomed experts in the field
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eBook $219.00
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  • ISBN 978-3-642-33956-1
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Hardcover $299.99
price for USA in USD
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Softcover $279.99
price for USA in USD
  • ISBN 978-3-662-51971-4
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About this book

This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology of nanomaterials and related processes by illustrating its exploitation, ranging from fundamental studies of the physics and chemistry of nanostructures to the ultimate goal of turnkey manufacturing control. This book is written for a broad readership: materials scientists, researchers, engineers, as well as students and nanotechnology operators who want to deepen their knowledge about both basics and applications of ellipsometry to nanoscale phenomena. It starts as a general introduction for people curious to enter the fields of ellipsometry and polarimetry applied to nanomaterials and progresses to articles by experts on specific fields that span from plasmonics, optics, to semiconductors and flexible electronics. The core belief reflected in this book is that ellipsometry applied at the nanoscale offers new ways of addressing many current needs. The book also explores forward-looking potential applications.

Table of contents (21 chapters)

Table of contents (21 chapters)
  • A Brief History and State of the Art of Ellipsometry

    Pages 1-30

    Irene, Eugene A.

  • Advanced Mueller Ellipsometry Instrumentation and Data Analysis

    Pages 31-143

    Garcia-Caurel, Enric (et al.)

  • Data Analysis for Nanomaterials: Effective Medium Approximation, Its Limits and Implementations

    Pages 145-178

    Humlicek, Josef

  • Relationship Between Surface Morphology and Effective Medium Roughness

    Pages 179-202

    Yanguas-Gil, Angel (et al.)

  • Plasmonics and Effective-Medium Theory

    Pages 203-224

    Aspnes, David E.

Buy this book

eBook $219.00
price for USA in USD
  • ISBN 978-3-642-33956-1
  • Digitally watermarked, DRM-free
  • Included format: PDF, EPUB
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $299.99
price for USA in USD
  • ISBN 978-3-642-33955-4
  • Free shipping for individuals worldwide
  • Institutional customers should get in touch with their account manager
  • Covid-19 shipping restrictions
  • Usually ready to be dispatched within 3 to 5 business days, if in stock
Softcover $279.99
price for USA in USD
  • ISBN 978-3-662-51971-4
  • Free shipping for individuals worldwide
  • Institutional customers should get in touch with their account manager
  • Covid-19 shipping restrictions
  • Usually ready to be dispatched within 3 to 5 business days, if in stock
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Bibliographic Information

Bibliographic Information
Book Title
Ellipsometry at the Nanoscale
Editors
  • Maria Losurdo
  • Kurt Hingerl
Copyright
2013
Publisher
Springer-Verlag Berlin Heidelberg
Copyright Holder
Springer-Verlag Berlin Heidelberg
eBook ISBN
978-3-642-33956-1
DOI
10.1007/978-3-642-33956-1
Hardcover ISBN
978-3-642-33955-4
Softcover ISBN
978-3-662-51971-4
Edition Number
1
Number of Pages
XXIV, 730
Topics