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Atomic Scale Interconnection Machines

Proceedings of the 1st AtMol European Workshop Singapore 28th-29th June 2011

  • Conference proceedings
  • © 2012

Overview

Editors:
  1. Christian Joachim

    1. , GNS, CNRS, Toulouse Cedex, France

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  • Addresses for the first time multi-probes (multi-channels) atomically precise interconnections to an atom circuit or to a single molecule circuit
  • Includes supplementary material: sn.pub/extras

Part of the book series: Advances in Atom and Single Molecule Machines (AASMM)

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Table of contents (17 papers)

  1. Front Matter

    Pages i-ix
    Download chapter PDF

  2. High Precision Local Electrical Probing: Potential and Limitations for the Analysis of Nanocontacts and Nanointerconnects

    • B. Guenther, M. Maier, J. Koeble, A. Bettac, F. Matthes, C. M. Schneider et al.
    Pages 1-8

  3. Ultra-Compact Multitip Scanning Probe Microscope with an Outer Diameter of 50 mm

    • Vasily Cherepanov, Evgeny Zubkov, Hubertus Junker, Stefan Korte, Marcus Blab, Peter Coenen et al.
    Pages 9-21

  4. Atomic Scale Interconnection Machine

    • O. A. Neucheva, R. Thamankar, T. L. Yap, C. Troadec, J. Deng, C. Joachim
    Pages 23-33

  5. The DUF Project: A UHV Factory for Multi-Interconnection of a Molecule Logic Gates on Insulating Substrate

    • D. Martrou, L. Guiraud, R. Laloo, B. Pecassou, P. Abeilhou, O. Guillermet et al.
    Pages 35-52

  6. Challenges and Advances in Instrumentation of UHV LT Multi-Probe SPM System

    • Zhouhang Wang
    Pages 53-79

  7. On the Road to Multi-Probe Non-Contact AFM

    • T. Vančura, S. Schmitt, V. Friedli, S. Torbrügge, O. Schaff
    Pages 81-87

  8. Atomically Precise Manufacturing: The Opportunity, Challenges, and Impact

    • John N. Randall, James R. Von Ehr, Joshua Ballard, James Owen, Rahul Saini, Ehud Fuchs et al.
    Pages 89-106

  9. Combined STM and Four-Probe Resistivity Measurements on Single Semiconductor Nanowires

    • M. Berthe, C. Durand, T. Xu, J. P. Nys, P. Caroff, B. Grandidier
    Pages 107-118

  10. Probing Electronic Transport of Individual Nanostructures with Atomic Precision

    • Shengyong Qin, An-Ping Li
    Pages 119-130

  11. Surface Conductance Measurements on a MoS2 Surface Using a UHV-Nanoprobe System

    • R. Thamankar, O. A. Neucheva, T. L. Yap, C. Joachim
    Pages 131-140

  12. Multi-Probe Characterization of 1D and 2D Nanostructures Assembled on Ge(001) Surface by Gold Atom Deposition and Annealing

    • M. Wojtaszek, M. Kolmer, S. Godlewski, J. Budzioch, B. Such, F. Krok et al.
    Pages 141-152

  13. Nanometer-Scale Four-Point Probe Resistance Measurements of Individual Nanowires by Four-Tip STM

    • S. Hasegawa, T. Hirahara, Y. Kitaoka, S. Yoshimoto, T. Tono, T. Ohba
    Pages 153-165

  14. Silicon Surface Conductance Investigated Using a Multiple-Probe Scanning Tunneling Microscope

    • Janik Zikovsky, Mark H. Salomons, Stanislav A. Dogel, Robert A. Wolkow
    Pages 167-179

  15. Atomic-Scale Devices in Silicon by Scanning Tunneling Microscopy

    • J. A. Miwa, M. Y. Simmons
    Pages 181-196

  16. Electronic Transport on the Nanoscale

    • C. A. Bobisch, A. M. Bernhart, M. R. Kaspers, M. C. Cottin, J. Schaffert, R. Möller
    Pages 197-214

  17. Solid State Nano Gears Manipulations

    • Cedric Troadec, Jie Deng, Francisco Ample, Ramesh Thamankar, Christian Joachim
    Pages 215-223

  18. Probing Single Molecular Motors on Solid Surface

    • Haiming Guo, Yeliang Wang, Min Feng, Li Gao, Hongjun Gao
    Pages 225-244
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Keywords

About this book

This volume documents the first International Workshop on Atomic Scale Interconnection Machines organised by the European Integrated Project AtMol in June 2011 in Singapore. The four sessions, discussed here in revised contributions by high level speakers, span the subjects of multi-probe UHV instrumentation, atomic scale nano-material nanowires characterization, atomic scale surface conductance measurements, surface atomic scale mechanical machineries. This state-of-the-art account brings academic researchers and industry engineers access to the tools they need to be at the forefront of the atomic scale technology revolution.

Editors and Affiliations

  • , GNS, CNRS, Toulouse Cedex, France

    Christian Joachim

About the editor

Dr Christian Joachim is First Class Director of Research at the Centre National de la Recherche Scientifique (CNRS), Nanoscience group (GNS) at CEMES/CNRS Toulouse (www.cemes.fr/GNS/) and Adjunct Professor of “Nanosciences and Quantum resources” at ISAE. He coordinated the EU-sponsored projects: BUN ("Bottom-up Nanomachines") and “Pico-Inside” (www.picoinside.org) and directed 2 NATO Advanced Research Workshops on Nanoscale Sciences in the early 1990’s. He is currently in charge of the French Midi-Pyrenees research effort in Nanoscience (CPER Campus G. Dupouy)" and of the new European Integrated Project “AtMol” (www.atmol.eu). He is also A*STAR VIP attached to IMRE to develop atomic scale technology in Singapore and WPI in charge of the Toulouse MANA satellite (MEXT Japan).

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