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NanoScience and Technology

Noncontact Atomic Force Microscopy

Volume 2

Editors: Morita, Seizo, Giessibl, Franz J., Wiesendanger, Roland (Eds.)

  • Is the most advanced state-of-the-art report on scanning probe microscopy
  • Presents the latest developments in STM and AFM
  • Deals with the various classes of materials studied
  • Is a valuable reference for researchers as well as a study text for graduate students
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Buy this book

eBook $149.00
price for USA in USD (gross)
  • ISBN 978-3-642-01495-6
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $249.99
price for USA in USD
  • ISBN 978-3-642-01494-9
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $199.99
price for USA in USD
  • ISBN 978-3-642-26070-4
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
About this book

Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.

Table of contents (18 chapters)

  • Introduction

    Morita, Seizo

    Pages 1-13

  • Method for Precise Force Measurements

    Abe, Masayuki (et al.)

    Pages 15-30

  • Force Spectroscopy on Semiconductor Surfaces

    Custance, Oscar (et al.)

    Pages 31-68

  • Tip–Sample Interactions as a Function of Distance on Insulating Surfaces

    Hoffmann, Regina

    Pages 69-94

  • Force Field Spectroscopy in Three Dimensions

    Schirmeisen, André (et al.)

    Pages 95-119

Buy this book

eBook $149.00
price for USA in USD (gross)
  • ISBN 978-3-642-01495-6
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $249.99
price for USA in USD
  • ISBN 978-3-642-01494-9
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $199.99
price for USA in USD
  • ISBN 978-3-642-26070-4
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
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Bibliographic Information

Bibliographic Information
Book Title
Noncontact Atomic Force Microscopy
Book Subtitle
Volume 2
Editors
  • Seizo Morita
  • Franz J. Giessibl
  • Roland Wiesendanger
Series Title
NanoScience and Technology
Copyright
2009
Publisher
Springer-Verlag Berlin Heidelberg
Copyright Holder
Springer-Verlag Berlin Heidelberg
eBook ISBN
978-3-642-01495-6
DOI
10.1007/978-3-642-01495-6
Hardcover ISBN
978-3-642-01494-9
Softcover ISBN
978-3-642-26070-4
Series ISSN
1434-4904
Edition Number
1
Number of Pages
XVIII, 401
Number of Illustrations
28 b/w illustrations, 77 illustrations in colour
Topics