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Springer Series in Materials Science

Image Processing of Edge and Surface Defects

Theoretical Basis of Adaptive Algorithms with Numerous Practical Applications

Authors: Louban, Roman

  • Detailed description of optical methods for defect recognition
  • Integrates the basics of the methods and their applications
  • Provides a reference for researchers and engineers
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eBook $119.00
price for USA in USD (gross)
  • ISBN 978-3-642-00683-8
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $169.99
price for USA in USD
  • ISBN 978-3-642-00682-1
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $159.99
price for USA in USD
  • ISBN 978-3-642-26035-3
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
About this book

The edge and surface inspection is one of the most important and most challenging tasks in quality assessment in industrial production. Typical defects are cracks, inclusions, pores, surface flakings, partial or complete tears of material surface and s.o. These defects can occur through defective source material or through extreme strain during machining process.

Detection of defects on a materialc surface can be complicated due to extremely varying degrees of material brightness or due to shadow areas, caused by the folding of the surface. Furthermore, impurities or surface discolourations can lead to artefacts that can be detected as pseudo-defects.

The brightness conditions on the edge of material defects are interpreted as a Gauss distribution of a radiation and used for a physical model. Basing on this model, an essentially new set of adaptive edge-based algorithms was developed. Using these methods, different types of defects can be detected, without the measurements being dependent on local or global brightness conditions of the image taken. The new adaptive edge-based algorithms allow a defect detection on different materials, like metal, ceramics, plastics and stone.

These methods make it possible to explicitly detect all kinds of different defects independently of their size, form and position and of the surface to be inspected. The adaptive edge-based methods provide a very wide spectrum of applications.

About the authors

Born on February 26, 1954 in Kiev, Ukraine.

1971 – 1976 Study at the State University of Woronezh, Russia. Graduation: Qualified physicist with award.

1977 – 1992 Scientific research at the Institute of Material Problems of the Science Academy, Kiev, Ukraine. Area of studies: plasma physics, composed materials.

1987 Promotion with the grade: Doctor of Engineering Sciences

1992 – 2006 hema electronic GmbH, Aalen, Department: machine vision, Development engineer, Project director. Main topic: Algorithmics for defect recognition on edges and surfaces

Since April 2006 Thermosensorik GmbH, Erlangen, Manager Software Engineering, IP Expert

Reviews

Aus den Rezensionen: “... Die HeIligkeitsverhältnisse an der Kante einer Materialbeschädigung werden als Gauß'sche Verteilung einer Strahlung interpretiert und in einem physikalischen Modell erfasst. Basierend auf diesem Modell wurden neue Methoden entwickelt, mit denen unterschiedliche Fehlertypen unabhängig von den Helligkeitsbedingungen eines aufgenommenen Bildes ermittelt werden können. ... Zahlreiche Anwendungsbeispiele veranschaulichen die theoretischen Ausführungen.“ (in: QZ Qualität und Zuverlässigkeit, March/2010, Issue 3, S. 13)

Table of contents (9 chapters)

  • Introduction

    Louban, Dr. Roman

    Pages 1-8

  • Edge Detection

    Louban, Dr. Roman

    Pages 9-29

  • Defect Detection on an Edge

    Louban, Dr. Roman

    Pages 31-45

  • Defect Detection on an Inhomogeneous High-Contrast Surface

    Louban, Dr. Roman

    Pages 47-70

  • Defect Detection on an Inhomogeneous Structured Surface

    Louban, Dr. Roman

    Pages 71-91

Buy this book

eBook $119.00
price for USA in USD (gross)
  • ISBN 978-3-642-00683-8
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $169.99
price for USA in USD
  • ISBN 978-3-642-00682-1
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $159.99
price for USA in USD
  • ISBN 978-3-642-26035-3
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
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Bibliographic Information

Bibliographic Information
Book Title
Image Processing of Edge and Surface Defects
Book Subtitle
Theoretical Basis of Adaptive Algorithms with Numerous Practical Applications
Authors
Series Title
Springer Series in Materials Science
Series Volume
123
Copyright
2009
Publisher
Springer-Verlag Berlin Heidelberg
Copyright Holder
Springer-Verlag Berlin Heidelberg
eBook ISBN
978-3-642-00683-8
DOI
10.1007/978-3-642-00683-8
Hardcover ISBN
978-3-642-00682-1
Softcover ISBN
978-3-642-26035-3
Series ISSN
0933-033X
Edition Number
1
Number of Pages
XI, 168
Number of Illustrations and Tables
120 b/w illustrations, 8 illustrations in colour
Topics