EMC 2008

STEM Aberration Correction: an Integrated Approach

Krivanek, Ondrej (et al.)

Pages 11-12

Applications of aberration-corrected TEM-STEM and high-resolution EELS for the study of functional materials

Botton, G. A. (et al.)

Pages 13-14

Aberration corrected TEM and STEM for dynamic in situ experiments

Gai, Pratibha L. (et al.)

Pages 15-16

HREM study of the SrTiO3 Σ3 (112) grain boundary

Dudeck, K. J. (et al.)

Pages 17-18

A Method to Measure Source Size in Aberration Corrected Electron Microscopes

Dwyer, C. (et al.)

Pages 19-20

Determining resolution in the transmission electron microscope: object-defined resolution below 0.5Å

Freitag, B. (et al.)

Pages 21-22

Direct measurement of aberrations by convergent-beam electron holography (CHEF)

Gatel, C. (et al.)

Pages 23-24

Atomic Structure of BiFeO3-BiCrO3 film on (111) SrTiO3 Grown by Dual Cross Beam Pulsed Laser Deposition

Gunawan, L. (et al.)

Pages 25-26

Demonstration of CC/CS-correction in HRTEM

Hartel, P. (et al.)

Pages 27-28

New electron diffraction technique using Cs-corrected annular LACDIF: comparison with electron precession

Houdellier, Florent (et al.)

Pages 29-30

The newly installed aberration corrected dedicated STEM (Hitachi HD2700C) at Brookhaven National Laboratory

Inada, H. (et al.)

Pages 31-32

Uranium single atom imaging and EELS mapping using aberration corrected STEM and LN2 cold stage

Inada, H. (et al.)

Pages 33-34

Sub-Ångstrøm Low-Voltage Electron Microscopy — future reality for deciphering the structure of beam-sensitive nanoobjects?

Kaiser, U. (et al.)

Pages 35-36

Detecting and resolving individual adatoms, vacancies, and their dynamics on graphene membranes

Meyer, J. C. (et al.)

Pages 37-38

Scanning confocal electron microscopy in a double aberration corrected transmission electron microscope

Nellist, P. D. (et al.)

Pages 39-40

Design of apochromatic TEM composed of usual round lenses

Nomura, S.

Pages 41-42

Back-Scattered Electron microscopy in Aberration corrected Electron microscope

Okunishi, E. (et al.)

Pages 43-44

Structure determination of H-encapsulating clathrate compounds in aberration-corrected STEM

Ramasse, Q. M. (et al.)

Pages 45-46

Performance of R005 Microscope and Aberration Correction System

Sawada, H. (et al.)

Pages 47-48

Optimum operation of Schottky electron sources: brightness, energy spread and stability

Kruit, P. (et al.)

Pages 49-50

The MANDOLINE filter and its performance

Essers, E. (et al.)

Pages 51-52

Using a monochromator to improve the resolution in focal-series reconstructed TEM down to 0.5Å

Tiemeijer, P. C. (et al.)

Pages 53-54

First performance measurements and application results of a new high brightness Schottky field emitter for HR-S/TEM at 80-300kV acceleration voltage

Freitag, B. (et al.)

Pages 55-56

Image Information transfer through a post-column energy filter detected by a lens-coupled CCD camera

Luecken, U. (et al.)

Pages 57-58

Third-rank computation of electron and ion optical systems with several and rotated Wien filters

Marianowski, Karin (et al.)

Pages 59-60

Wavelength dispersive soft X-ray emission spectroscopy attached to TEM using multi-capirary X-ray lens

Muto, S. (et al.)

Pages 61-62

Miniature electrostatic-magnetostatic column for electrons

Rochow, C. (et al.)

Pages 63-64

Comparison of monochromated electron energy-loss with X-ray absorption near-edge spectra: ELNES vs. XANES

Walther, T. (et al.)

Pages 65-66

A hybrid electron energy loss spectrometer with simultaneous serial and parallel detection

Yuan, Jun (et al.)

Pages 67-68

In-focus phase contrast: Present state and future developments

Schröder, R. R. (et al.)

Pages 69-70

The Detective Quantum Efficiency of Electron Area Detectors

Henderson, R. (et al.)

Pages 71-72

Experimental observation of the improvement in MTF from backthinning a CMOS direct electron detector

McMullan, G. (et al.)

Pages 73-74

High speed simultaneous X-ray and electron imaging and spectroscopy at synchrotrons and TEMs

Strüder, Lothar

Pages 75-76

The image intensity in Zernike mode with electrons

Beleggia, M.

Pages 77-78

Application of a Hilbert phase plate in transmission electron microscopy of materials science samples

Dries, M. (et al.)

Pages 79-80

Optimal Imaging Parameters in Cs-Corrected Transmission Electron Microscopy with a Physical Phase Plate

Gamm, B. (et al.)

Pages 81-82

Electron optical design of the Phase Aberration Corrected Electron Microscope

Matijevic, M. (et al.)

Pages 83-84

Direct electron detectors for TEM

Moldovan, G. (et al.)

Pages 85-86

A Newly Developed 64 MegaPixel camera for Transmission Electron Microscopy

Tietz, H. R.

Pages 87-88

Characterization of a fiber-optically coupled 8k CCD/CMOS device

Tietz, D. (et al.)

Pages 89-90

Direct Single-Electron Imaging using a pnCCD Detector

Ziegler, Alexander (et al.)

Pages 91-92

Quantitative TEM and STEM Simulations

Koch, C. T.

Pages 93-94

Quantitative determination of the chemical composition of an alloy by High Angle Annular Dark Field imaging

Grillo, V. (et al.)

Pages 95-96

The benefits of statistical parameter estimation theory for quantitative interpretation of electron microscopy data

Aert, S. (et al.)

Pages 97-98