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  • Book
  • © 2009

Applied Scanning Probe Methods XII

Characterization

  • First book summarizing the state of the art of this technique
  • Real industrial applications included
  • Includes supplementary material: sn.pub/extras

Part of the book series: NanoScience and Technology (NANO)

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Table of contents (9 chapters)

  1. Front Matter

    Pages I-LV
  2. Imaging Chemical Groups and Molecular Recognition Sites on Live Cells Using AFM

    • David Alsteens, Vincent Dupres, Etienne Dague, Claire Verbelen, Guillaume André, Grégory Francius et al.
    Pages 33-48
  3. Mechanical Characterization of Materials by Micro-Indentation and AFM Scanning

    • Gabriella Bolzon, Massimiliano Bocciarelli, Enzo J. Chiarullo
    Pages 85-120
  4. Mechanical Properties of Metallic Nanocontacts

    • G. Rubio-Bollinger, J.J. Riquelme, S. Vieira, N. Agraït
    Pages 121-147
  5. Dynamic AFM in Liquids: Viscous Damping and Applications to the Study of Confined Liquids

    • Abdelhamid Maali, Touria Cohen-Bouhacina, Cedric Hurth, Cédric Jai, R. Boisgard, Jean-Pierre Aimé
    Pages 149-164
  6. Back Matter

    Pages 221-224

About this book

Crack initiation and growth are key issues when it comes to the mechanical reliab- ity of microelectronic devices and microelectromechanical systems (MEMS). Es- cially in organic electronics where exible substrates will play a major role these issues will become of utmost importance. It is therefore necessary to develop me- ods which in situ allow the experimental investigation of surface deformation and fracture processes in thin layers at a micro and nanometer scale. While scanning electron microscopy (SEM) might be used it is also associated with some major experimental drawbacks. First of all if polymers are investigated they usually have to be coated with a metal layer due to their commonly non-conductive nature. Additi- ally they might be damaged by the electron beam of the microscope or the vacuum might cause outgasing of solvents or evaporation of water and thus change material properties. Furthermore, for all kinds of materials a considerable amount of expe- mental effort is necessary to build a tensile testing machine that ts into the chamber. Therefore, a very promising alternative to SEM is based on the use of an atomic force microscope (AFM) to observe in situ surface deformation processes during straining of a specimen. First steps towards this goal were shown in the 1990s in [1–4] but none of these approaches truly was a microtensile test with sample thicknesses in the range of micrometers. To the authors’ knowledge, this was shown for the rst time by Hild et al. in [5]. 16.

Reviews

From the reviews:

"Vol. XII contains nine contributions … of SPM applications on a variety of systems including biological systems for the measurement of receptor-ligand interaction, the imaging of chemical groups on living cells, and the imaging of chemical groups on live cells. These biological applications are complemented by nearfield optical microscopy in life science … . Each chapter … will make profitable reading for researchers at all experience levels. … All the chapters are … beautifully illustrated and in color too, also along with graphs, equations etc." (Current Engineering Practice, 2009)

“The articles … are written in sufficient detail, so that university students, researchers and engineers can understand the physics of the instruments, the design and construction of the devices and the cantilevers, the signal processing algorithms, and their use in imaging and the surface characterization of the specimens. … highlight various studies, techniques and applications that permit us to image, modify, fabricate and control structures at the molecular and atomic level. … well-written and clearly illustrated.” (Barry R. Masters, Optics & Photonics News, September, 2009)

Editors and Affiliations

  • Nanoprobe Laboratory for Bio- & Nanotechnology & Biomimetics (NLB2), Ohio State University, Columbus, USA

    Bharat Bhushan

  • Universität Münster FB 16 Physikalisches Institut, Germany

    Harald Fuchs

Bibliographic Information

Buy it now

Buying options

eBook USD 89.00
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book USD 119.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book USD 169.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Other ways to access