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An External Interface for Processing 3-D Holographic and X-Ray Images

  • Book
  • © 1989

Overview

Editors:
  1. Werner Jüptner

    1. BIAS — Bremer Institut für angewandte Strahltechnik, Bremen 71, Germany

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  2. Thomas Kreis

    1. BIAS — Bremer Institut für angewandte Strahltechnik, Bremen 71, Germany

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    You can also search for this editor in PubMed   Google Scholar

Part of the book series: Research Reports Esprit (ESPRIT, volume 1)

Part of the book sub series: Project 898. PHOX (1258)

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Table of contents (7 chapters)

  1. Front Matter

    Pages I-IX
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  2. Introduction

    • Werner Jüptner, Thomas Kreis
    Pages 1-4

  3. Aim of ESPRIT project 898

    • Werner Jüptner, Thomas Kreis
    Pages 5-8

  4. Deformation measurement by holographic interferometry

    • Werner Jüptner, Thomas Kreis
    Pages 9-44

  5. Structural and stress analysis

    • Werner Jüptner, Thomas Kreis
    Pages 45-66

  6. Component Inspection by X-Ray Radiography

    • Werner Jüptner, Thomas Kreis
    Pages 67-106

  7. Microfocus X-ray testing

    • Werner Jüptner, Thomas Kreis
    Pages 107-145

  8. Conclusions and future prospects

    • Werner Jüptner, Thomas Kreis
    Pages 146-147
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Keywords

About this book

Internationally recognized experts in the field of holographic interferometric testing, X-ray testing, and structural analysis by finite element techniques have come together in ESPRIT project 898 to develop a system that integrates these techniques. This system acts as an external interface between the complementary nondestructive testing methods and computer based structural analysis. In the book the testing and analysis techniques are presented and compared with special emphasis on problems regarding their combination and integration. The architecture and the components of the interface system are described. Experiments proving the feasibility and applicability of the concepts are presented. The chapters of the book dealing with the different techniques are written by the individual partners of the project. A common test object is investigated by all techniques. The book helps the customer to select the testing and analysis method most suitable for his problem. It also presents the background for building up integrated testing equipment for analysis and control.

Editors and Affiliations

  • BIAS — Bremer Institut für angewandte Strahltechnik, Bremen 71, Germany

    Werner Jüptner, Thomas Kreis

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