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Springer Tracts in Modern Physics

High-Resolution X-Ray Scattering from Thin Films and Multilayers

Authors: Holy, Vaclav, Pietsch, Ullrich, Baumbach, Tilo

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  • - First monograph on thin-layer and multilayer x-ray analysis
  • - Up-to-date review
  • - Critical overview of the literature
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eBook $74.99
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  • ISBN 978-3-540-49625-0
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About this book

This critical overview presents experimental methods for solving most frequent strucutral problems of mono-crystalline thin films and layered systems:
thickness, crystalline state, strain distribution, interface quality and other properties. A unified theoretical approach based on kinematical and dynamical scattering theories describes the experimental methods. This book is a ready-to-hand reference for experimentalists who want to improve their knowledge on modern x-ray methods for thin-film analysis.

Table of contents (12 chapters)

Table of contents (12 chapters)

Buy this book

eBook $74.99
price for USA in USD (gross)
  • The eBook version of this title will be available soon
  • ISBN 978-3-540-49625-0
  • Digitally watermarked, DRM-free
  • Included format:
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
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Bibliographic Information

Bibliographic Information
Book Title
High-Resolution X-Ray Scattering from Thin Films and Multilayers
Authors
Series Title
Springer Tracts in Modern Physics
Series Volume
149
Copyright
1999
Publisher
Springer-Verlag Berlin Heidelberg
Copyright Holder
Springer-Verlag Berlin Heidelberg
eBook ISBN
978-3-540-49625-0
DOI
10.1007/BFb0109385
Series ISSN
0081-3869
Edition Number
1
Number of Pages
XI, 258
Number of Illustrations
140 b/w illustrations
Topics