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Lecture Notes in Physics

Nanoscale Spectroscopy and Its Applications to Semiconductor Research

Editors: Watanabe, Y., Heun, S., Salviati, G., Yamamoto, N. (Eds.)

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Hardcover $179.99
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  • ISBN 978-3-540-43312-5
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Softcover $119.99
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  • ISBN 978-3-662-14372-8
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About this book

Fabrication technologies for nanostructured devices have be- en developed recently, and the electrical and optical pro- perties of such nanostructures are a subject of advanced re- search. This book describes the different approaches to spectroscopic microscopy, i.e., electron beam probe spec- troscopy, spectroscopic photoelectron microscopy, and scan- ning probe spectroscopy. It will be useful as a compact source of reference for the experienced researcher, taking into account at the same time the needs of postgraduate stu- dents and nonspecialist researchers by using a tutorial ap- proach throughout. Fabrication technologies for nano-structured devices have been developed recently, and the electrical and optical properties of such nonostructures are a subject of advanced research. This book describes the different approaches to spectroscopic microscopy, that is, Electron Beam Probe Spectroscopy, Spectroscopic Photoelectron Microscopy, and Scanning Probe Spectroscopy. It will be useful as a compact source of reference for the experienced reseracher,taking at the same time into account the needs of post graduate students and nonspecialist researchers by using a tutorial approach throughout.

Reviews

"This is an unusual collection and the vast audience of workers on semiconductor structure will want to have access to it." (Ultramicroscopy, 99, 2004)


Table of contents (27 chapters)

Table of contents (27 chapters)
  • Introduction

    Pages 1-7

    Heun, S. (et al.)

  • Spectro-microscopy by TEM-SEM

    Pages 11-23

    Yagi, K. (et al.)

  • Determination of Nanosize Particle Distribution by Low Frequency Raman Scattering: Comparison to Electron Microscopy

    Pages 24-36

    Ivanda, M. (et al.)

  • Development of Cathodoluminescence (CL) for Semiconductor Research, Part I: TEM-CL Study of Microstructures and Defects in Semiconductor Epilayers

    Pages 37-51

    Yamamoto, N.

  • Development of CL for Semiconductor Research, Part II: Cathodoluminescence Study of Semiconductor Nanoparticles and Nanostructures Using Low-Electron-Beam Energies

    Pages 52-60

    Sekiguchi, T.

Buy this book

eBook $89.00
price for USA in USD (gross)
  • ISBN 978-3-540-45850-0
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $179.99
price for USA in USD
  • ISBN 978-3-540-43312-5
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $119.99
price for USA in USD
  • ISBN 978-3-662-14372-8
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
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Bibliographic Information

Bibliographic Information
Book Title
Nanoscale Spectroscopy and Its Applications to Semiconductor Research
Editors
  • Y. Watanabe
  • S. Heun
  • G. Salviati
  • N. Yamamoto
Series Title
Lecture Notes in Physics
Series Volume
588
Copyright
2002
Publisher
Springer-Verlag Berlin Heidelberg
Copyright Holder
Springer-Verlag Berlin Heidelberg
eBook ISBN
978-3-540-45850-0
DOI
10.1007/3-540-45850-6
Hardcover ISBN
978-3-540-43312-5
Softcover ISBN
978-3-662-14372-8
Series ISSN
0075-8450
Edition Number
1
Number of Pages
XV, 308
Topics