Springer Series in Materials Science

Point Defects in Semiconductors and Insulators

Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions

Authors: Spaeth, Johann-Martin, Overhof, Harald

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About this book

This book introduces the principles and techniques of modern electron paramagnetic resonance (EPR) spectroscopy that are essential for applications used to determine  microscopic defect structures. Many different magnetic resonance methods are required for investigating the microscopic and electronic properties of solids and uncovering correlations between those properties. In addition to EPR such methods include electron nuclear double resonance (ENDOR), electronically and optically detected EPR (the latter is known as ODENDOR), and electronically and optically detected ENDOR. This book comprehensively discusses experimental, technological, and theoretical aspects of these techniques from a practical point of view with many illustrative examples taken from semiconductors and insulators. The non-specialist is informed about the potential of the different methods. A researcher finds practical help in the application of commercial apparatus as well as useful guidance from ab initio theory for the task of deriving structure models from experimental data.

Table of contents (9 chapters)

Table of contents (9 chapters)

Buy this book

eBook $169.00
price for USA in USD
  • ISBN 978-3-642-55615-9
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $299.99
price for USA in USD
  • ISBN 978-3-540-42695-0
  • Free shipping for individuals worldwide
  • Institutional customers should get in touch with their account manager
  • Covid-19 shipping restrictions
  • Usually ready to be dispatched within 3 to 5 business days, if in stock
Softcover $219.99
price for USA in USD
  • ISBN 978-3-642-62722-4
  • Free shipping for individuals worldwide
  • Institutional customers should get in touch with their account manager
  • Covid-19 shipping restrictions
  • Usually ready to be dispatched within 3 to 5 business days, if in stock
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Bibliographic Information

Bibliographic Information
Book Title
Point Defects in Semiconductors and Insulators
Book Subtitle
Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions
Authors
Series Title
Springer Series in Materials Science
Series Volume
51
Copyright
2003
Publisher
Springer-Verlag Berlin Heidelberg
Copyright Holder
Springer-Verlag Berlin Heidelberg
eBook ISBN
978-3-642-55615-9
DOI
10.1007/978-3-642-55615-9
Hardcover ISBN
978-3-540-42695-0
Softcover ISBN
978-3-642-62722-4
Series ISSN
0933-033X
Edition Number
1
Number of Pages
XI, 492
Topics