Overview
- Editors:
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Bharat Bhushan
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Nanotribology Laboratory for Information Storage and MEMS/NEMS (NLIM) W390 Scott Laboratory, The Ohio State University, Columbus, USA
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Harald Fuchs
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Center for Nanotechnology (CeNTech) and Institute of Physics, University of Münster, Münster, Germany
- First book summarizing the state-of-the-art of this technique
- Real industrial applications included
- Includes supplementary material: sn.pub/extras
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Table of contents (9 chapters)
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- Michael Nosonovsky, Bharat Bhushan
Pages 1-40
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- Bharat Bhushan, Robert A. Sayer
Pages 41-76
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- Horacio D. Espinosa, Nicolaie Moldovan, K.-H. Kim
Pages 77-134
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- Horacio D. Espinosa, Changhong Ke
Pages 135-196
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- Jeppe Vang Lauritsen, Ronny T. Vang, Flemming Besenbacher
Pages 197-224
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- Claude Martelet, Nicole Jaffrezic-Renault, Yanxia Hou, Abdelhamid Errachid, François Bessueille
Pages 225-257
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- Gunther Wittstock, Malte Burchardt, Sascha E. Pust
Pages 259-299
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- Bharat Bhushan, Huiwen Liu
Pages 349-366
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Back Matter
Pages 367-380
About this book
The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I–IV that a large number of technical and applicational aspects are present and rapidly - veloping worldwide. Considering the success of Vols. I–IV and the fact that further colleagues from leading laboratories were ready to contribute their latest achie- ments, we decided to expand the series with articles touching ?elds not covered in the previous volumes. The response and support of our colleagues were excellent, making it possible to edit another three volumes of the series. In contrast to to- cal conference proceedings, the applied scanning probe methods intend to give an overview of recent developments as a compendium for both practical applications and recent basic research results, and novel technical developments with respect to instrumentation and probes. The present volumes cover three main areas: novel probes and techniques (Vol. V), charactarization (Vol. VI), and biomimetics and industrial applications (Vol. VII). Volume V includes an overview of probe and sensor technologies including integrated cantilever concepts, electrostatic microscanners, low-noise methods and improved dynamic force microscopy techniques, high-resonance dynamic force - croscopy and the torsional resonance method, modelling of tip cantilever systems, scanning probe methods, approaches for elasticity and adhesion measurements on the nanometer scale as well as optical applications of scanning probe techniques based on near?eld Raman spectroscopy and imaging.
Editors and Affiliations
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Nanotribology Laboratory for Information Storage and MEMS/NEMS (NLIM) W390 Scott Laboratory, The Ohio State University, Columbus, USA
Bharat Bhushan
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Center for Nanotechnology (CeNTech) and Institute of Physics, University of Münster, Münster, Germany
Harald Fuchs
