NanoScience and Technology Applied Scanning Probe Methods
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Applied Scanning Probe Methods VI

Characterization

Editors: Bhushan, Bharat, Kawata, Satoshi (Eds.)

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About this book

The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I–IV that a large number of technical and applicational aspects are present and rapidly - veloping worldwide. Considering the success of Vols. I–IV and the fact that further colleagues from leading laboratories were ready to contribute their latest achie- ments, we decided to expand the series with articles touching ?elds not covered in the previous volumes. The response and support of our colleagues were excellent, making it possible to edit another three volumes of the series. In contrast to to- cal conference proceedings, the applied scanning probe methods intend to give an overview of recent developments as a compendium for both practical applications and recent basic research results, and novel technical developments with respect to instrumentation and probes. The present volumes cover three main areas: novel probes and techniques (Vol. V), charactarization (Vol. VI), and biomimetics and industrial applications (Vol. VII). Volume V includes an overview of probe and sensor technologies including integrated cantilever concepts, electrostatic microscanners, low-noise methods and improved dynamic force microscopy techniques, high-resonance dynamic force - croscopy and the torsional resonance method, modelling of tip cantilever systems, scanning probe methods, approaches for elasticity and adhesion measurements on the nanometer scale as well as optical applications of scanning probe techniques based on near?eld Raman spectroscopy and imaging.

Table of contents (10 chapters)

Table of contents (10 chapters)
  • Scanning Tunneling Microscopy of Physisorbed Monolayers: From Self-Assembly to Molecular Devices

    Pages 1-30

    Müller, Thomas

  • Tunneling Electron Spectroscopy Towards Chemical Analysis of Single Molecules

    Pages 31-63

    Komeda, Tadahiro

  • STM Studies on Molecular Assembly at Solid/Liquid Interfaces

    Pages 65-100

    Yamada, Ryo (et al.)

  • Single-Molecule Studies on Cells and Membranes Using the Atomic Force Microscope

    Pages 101-125

    Kienberger, Ferry (et al.)

  • Atomic Force Microscopy of DNA Structure and Interactions

    Pages 127-164

    Thomson, Neil H.

Buy this book

eBook $149.00
price for USA in USD
  • ISBN 978-3-540-37319-3
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $199.99
price for USA in USD
  • ISBN 978-3-540-37318-6
  • Free shipping for individuals worldwide
  • Institutional customers should get in touch with their account manager
  • Covid-19 shipping restrictions
  • Usually ready to be dispatched within 3 to 5 business days, if in stock
Softcover $199.99
price for USA in USD
  • ISBN 978-3-642-07212-3
  • Free shipping for individuals worldwide
  • Institutional customers should get in touch with their account manager
  • Covid-19 shipping restrictions
  • Usually ready to be dispatched within 3 to 5 business days, if in stock
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Bibliographic Information

Bibliographic Information
Book Title
Applied Scanning Probe Methods VI
Book Subtitle
Characterization
Editors
  • Bharat Bhushan
  • Satoshi Kawata
Series Title
NanoScience and Technology
Copyright
2007
Publisher
Springer-Verlag Berlin Heidelberg
Copyright Holder
Springer-Verlag Berlin Heidelberg
eBook ISBN
978-3-540-37319-3
DOI
10.1007/11776314
Hardcover ISBN
978-3-540-37318-6
Softcover ISBN
978-3-642-07212-3
Series ISSN
1434-4904
Edition Number
1
Number of Pages
XLV, 338
Topics