Editors:
- First book summarizing the state-of-the-art of this technique
- Real industrial applications included
- Includes supplementary material: sn.pub/extras
Part of the book series: NanoScience and Technology (NANO)
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Table of contents (10 chapters)
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Front Matter
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Back Matter
About this book
Editors and Affiliations
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Nanotribology Laboratory for Information Storage and MEMS/NEMS (NLIM) 390 Scott Laboratory, The Ohio State University, Columbus, USA
Bharat Bhushan
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Graduate School of Science, Department of Mathematics, Osaka City University, Osaka, Japan
Satoshi Kawata
Bibliographic Information
Book Title: Applied Scanning Probe Methods VI
Book Subtitle: Characterization
Editors: Bharat Bhushan, Satoshi Kawata
Series Title: NanoScience and Technology
DOI: https://doi.org/10.1007/11776314
Publisher: Springer Berlin, Heidelberg
eBook Packages: Chemistry and Materials Science, Chemistry and Material Science (R0)
Copyright Information: Springer-Verlag Berlin Heidelberg 2007
Hardcover ISBN: 978-3-540-37318-6Published: 18 October 2006
Softcover ISBN: 978-3-642-07212-3Published: 25 November 2010
eBook ISBN: 978-3-540-37319-3Published: 07 November 2006
Series ISSN: 1434-4904
Series E-ISSN: 2197-7127
Edition Number: 1
Number of Pages: XLV, 338
Topics: Nanotechnology and Microengineering, Nanotechnology, Surfaces and Interfaces, Thin Films, Polymer Sciences, Physical Chemistry, Solid State Physics