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Springer Series in Materials Science

Lifetime Spectroscopy

A Method of Defect Characterization in Silicon for Photovoltaic Applications

Authors: Rein, Stefan

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eBook $219.00
price for USA in USD (gross)
  • ISBN 978-3-540-27922-8
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Hardcover $299.99
price for USA in USD
  • ISBN 978-3-540-25303-7
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Softcover $279.99
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  • ISBN 978-3-642-06453-1
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About this book

Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. Since it is based on the recombination process, it provides insight into precisely those defects that are relevant to semiconductor devices such as solar cells. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques. The various theoretical predictions are verified experimentally with the context of a comprehensive study on different metal impurities. The quality and consistency of the spectroscopic results, as explained here, confirms the excellent performance of lifetime spectroscopy.

About the authors

10/99 "Gustav-Mie-Preis" awarded for the diploma thesis by the Faculty of Physics at Albert-Ludwigs-University Freiburg

09/99 – 05/04 PhD thesis in physics at Fraunhofer ISE and University of Konstanz:
"Lifetime spectroscopy as a method of defect characterization in silicon for photovoltaic applications" (overall grade: summa cum laude)

08/95 – 01/97 Undergraduate assistant at Fraunhofer ISE in the area of solar cell
characterization

12/98 – 08/99 Research assistant at Fraunhofer ISE
1. in the department of solar cells – materials – technology
2. in the department of thermal optical systems

06/04 – today Research assistant at Fraunhofer ISE

Table of contents (8 chapters)

Table of contents (8 chapters)

Buy this book

eBook $219.00
price for USA in USD (gross)
  • ISBN 978-3-540-27922-8
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $299.99
price for USA in USD
  • ISBN 978-3-540-25303-7
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $279.99
price for USA in USD
  • ISBN 978-3-642-06453-1
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
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Bibliographic Information

Bibliographic Information
Book Title
Lifetime Spectroscopy
Book Subtitle
A Method of Defect Characterization in Silicon for Photovoltaic Applications
Authors
Series Title
Springer Series in Materials Science
Series Volume
85
Copyright
2005
Publisher
Springer-Verlag Berlin Heidelberg
Copyright Holder
Springer-Verlag Berlin Heidelberg
eBook ISBN
978-3-540-27922-8
DOI
10.1007/3-540-27922-9
Hardcover ISBN
978-3-540-25303-7
Softcover ISBN
978-3-642-06453-1
Series ISSN
0933-033X
Edition Number
1
Number of Pages
XXVI, 492
Topics