Overview
- Presents the ellipsometry characterization of solar cell materials/devices
- Provides easy-to-follow explanations of ellipsometry data analysis
- Includes optical constants for all solar cell component layers
Part of the book series: Springer Series in Optical Sciences (SSOS, volume 214)
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Table of contents (13 chapters)
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Front Matter
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Application of Ellipsometry Technique
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Front Matter
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Optical Data of Solar-Cell Component Materials
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Front Matter
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Back Matter
Keywords
About this book
Spectroscopic ellipsometry has been applied to a wide variety of material and device characterizations in solar cell research fields. In particular, device performance analyses using exact optical constants of component layers and direct analyses of complex solar cell structures are unique features of advanced ellipsometry methods. This second volume of Spectroscopic Ellipsometry for Photovoltaics presents various applications of the ellipsometry technique for device analyses, including optical/recombination loss analyses, real-time control and on-line monitoring of solar cell structures, and large-area structural mapping. Furthermore, this book describes the optical constants of 148 solar cell component layers, covering a broad range of materials from semiconductor light absorbers (inorganic, organic and hybrid perovskite semiconductors) to transparent conductive oxides and metals. The tabulated and completely parameterized optical constants described in this book are the most current resource that is vital for device simulations and solar cell structural analyses.
Editors and Affiliations
About the editors
Hiroyuki Fujiwara received the Ph.D. degree from Tokyo Institute of Technology. He was a research associate at The Pennsylvania State University. In 1998, he joined Electrotechnical laboratory, Ministry of International Trade and Industry, Japan. Later in 2007, he became a team leader of Research Center for Photovoltaics, National Institute of Advanced Industrial Science and Technology (AIST) in Japan. He is currently a professor in the Department of Electrical, Electronic and Computer Engineering, Gifu University.
Robert W. Collins received the Ph.D. degree from Harvard University. He worked at BP America/Standard Oil Co. In 1992, he became a professor of Physics and Materials Research at The Pennsylvania State University. He is currently a Distinguished University Professor and NEG Endowed Chair of Silicate and Materials Science with the Department of Physics and Astronomy, University of Toledo. He co-directs the Center for Photovoltaics Innovation and Commercialization.
Bibliographic Information
Book Title: Spectroscopic Ellipsometry for Photovoltaics
Book Subtitle: Volume 2: Applications and Optical Data of Solar Cell Materials
Editors: Hiroyuki Fujiwara, Robert W. Collins
Series Title: Springer Series in Optical Sciences
DOI: https://doi.org/10.1007/978-3-319-95138-6
Publisher: Springer Cham
eBook Packages: Physics and Astronomy, Physics and Astronomy (R0)
Copyright Information: Springer Nature Switzerland AG 2018
Hardcover ISBN: 978-3-319-95137-9Published: 23 January 2019
eBook ISBN: 978-3-319-95138-6Published: 10 January 2019
Series ISSN: 0342-4111
Series E-ISSN: 1556-1534
Edition Number: 1
Number of Pages: XXI, 616
Number of Illustrations: 126 b/w illustrations, 204 illustrations in colour
Topics: Optics, Lasers, Photonics, Optical Devices, Optical and Electronic Materials, Spectroscopy and Microscopy, Renewable and Green Energy, Microwaves, RF and Optical Engineering