Confocal Raman Microscopy
Editors: Toporski, Jan, Dieing, Thomas, Hollricher, Olaf (Eds.)
Free Preview- Presents a comprehensive overview of confocal Raman microscopy
- Provides in-depth explanations of the technique
- Includes real-world application examples from virtually every field of the natural sciences
- Completely updated and revised, and includes several new chapters
Buy this book
- About this book
-
This second edition provides a cutting-edge overview of physical, technical and scientific aspects related to the widely used analytical method of confocal Raman microscopy. The book includes expanded background information and adds insights into how confocal Raman microscopy, especially 3D Raman imaging, can be integrated with other methods to produce a variety of correlative microscopy combinations. The benefits are then demonstrated and supported by numerous examples from the fields of materials science, 2D materials, the life sciences, pharmaceutical research and development, as well as the geosciences.
- Table of contents (23 chapters)
-
-
Raman’s Discovery in Historical Context
Pages 3-21
-
High Resolution Optical and Confocal Microscopy
Pages 25-45
-
Introduction to the Fundamentals of Raman Spectroscopy
Pages 47-68
-
Raman Instrumentation for Confocal Raman Microscopy
Pages 69-87
-
Software Requirements and Data Analysis in Confocal Raman Microscopy
Pages 89-120
-
Table of contents (23 chapters)
Recommended for you

Bibliographic Information
- Bibliographic Information
-
- Book Title
- Confocal Raman Microscopy
- Editors
-
- Jan Toporski
- Thomas Dieing
- Olaf Hollricher
- Series Title
- Springer Series in Surface Sciences
- Series Volume
- 66
- Copyright
- 2018
- Publisher
- Springer International Publishing
- Copyright Holder
- Springer International Publishing AG
- eBook ISBN
- 978-3-319-75380-5
- DOI
- 10.1007/978-3-319-75380-5
- Hardcover ISBN
- 978-3-319-75378-2
- Softcover ISBN
- 978-3-030-09217-7
- Series ISSN
- 0931-5195
- Edition Number
- 2
- Number of Pages
- XXIV, 596
- Additional Information
- Originally published as volume 158 in the series: Springer Series in Optical Sciences
- Topics