Editors:
- Presents ellipsometry characterization of solar cell materials/devices
- Provides easy-to-understand explanations of ellipsometry data analysis
- Includes optical constants for all solar-cell component layers
Part of the book series: Springer Series in Optical Sciences (SSOS, volume 212)
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Table of contents (19 chapters)
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Front Matter
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Fundamental Principles of Ellipsometry
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Front Matter
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Characterization of Materials and Structures
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Front Matter
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About this book
This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community.
The book describes optical constants of a variety of semiconductor light absorbers, transparent conductive oxides and metals that are vital for the interpretation of solar cell characteristics and device simulations. It is divided into four parts: fundamental principles of ellipsometry; characterization of solar cell materials/structures; ellipsometry applications including optical simulations of solar cell devices and online monitoring of film processing; and the optical constants of solar cell component layers.
Keywords
Editors and Affiliations
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Department of Electrical, Electronic and Computer Engineering, Gifu University, Gifu, Japan
Hiroyuki Fujiwara
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Department of Physics and Astronomy, The University of Toledo, Toledo, USA
Robert W. Collins
About the editors
Hiroyuki Fujiwara received the Ph.D. degree from Tokyo Institute of Technology. He was a research associate at The Pennsylvania State University. In 1998, he joined Electrotechnical laboratory, Ministry of International Trade and Industry, Japan. Later in 2007, he became a team leader of Research Center for Photovoltaics, National Institute of Advanced Industrial Science and Technology (AIST) in Japan. He is currently a professor in the Department of Electrical, Electronic and Computer Engineering, Gifu University.
Robert W. Collins received the Ph.D. degree from Harvard University. He worked at BP America/Standard Oil Co. In 1992, he became a professor of Physics and Materials Research at The Pennsylvania State University. He is currently a Distinguished University Professor and NEG Endowed Chair of Silicate and Materials Science with the Department of Physics and Astronomy, University of Toledo. He co-directs the Center for Photovoltaics Innovation and Commercialization.
Bibliographic Information
Book Title: Spectroscopic Ellipsometry for Photovoltaics
Book Subtitle: Volume 1: Fundamental Principles and Solar Cell Characterization
Editors: Hiroyuki Fujiwara, Robert W. Collins
Series Title: Springer Series in Optical Sciences
DOI: https://doi.org/10.1007/978-3-319-75377-5
Publisher: Springer Cham
eBook Packages: Physics and Astronomy, Physics and Astronomy (R0)
Copyright Information: Springer International Publishing AG, part of Springer Nature 2018
Hardcover ISBN: 978-3-319-75375-1Published: 24 January 2019
eBook ISBN: 978-3-319-75377-5Published: 10 January 2019
Series ISSN: 0342-4111
Series E-ISSN: 1556-1534
Edition Number: 1
Number of Pages: XX, 594
Number of Illustrations: 70 b/w illustrations, 266 illustrations in colour
Topics: Optics, Lasers, Photonics, Optical Devices, Optical and Electronic Materials, Microwaves, RF and Optical Engineering, Renewable and Green Energy