Spectroscopic Ellipsometry for Photovoltaics
Volume 1: Fundamental Principles and Solar Cell Characterization
Editors: Fujiwara, Hiroyuki, Collins, Robert W. (Eds.)
Free Preview- Presents ellipsometry characterization of solar cell materials/devices
- Provides easy-to-understand explanations of ellipsometry data analysis
- Includes optical constants for all solar-cell component layers
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- About this book
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This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community.
The book describes optical constants of a variety of semiconductor light absorbers, transparent conductive oxides and metals that are vital for the interpretation of solar cell characteristics and device simulations. It is divided into four parts: fundamental principles of ellipsometry; characterization of solar cell materials/structures; ellipsometry applications including optical simulations of solar cell devices and online monitoring of film processing; and the optical constants of solar cell component layers.
- About the authors
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Hiroyuki Fujiwara received the Ph.D. degree from Tokyo Institute of Technology. He was a research associate at The Pennsylvania State University. In 1998, he joined Electrotechnical laboratory, Ministry of International Trade and Industry, Japan. Later in 2007, he became a team leader of Research Center for Photovoltaics, National Institute of Advanced Industrial Science and Technology (AIST) in Japan. He is currently a professor in the Department of Electrical, Electronic and Computer Engineering, Gifu University.
Robert W. Collins received the Ph.D. degree from Harvard University. He worked at BP America/Standard Oil Co. In 1992, he became a professor of Physics and Materials Research at The Pennsylvania State University. He is currently a Distinguished University Professor and NEG Endowed Chair of Silicate and Materials Science with the Department of Physics and Astronomy, University of Toledo. He co-directs the Center for Photovoltaics Innovation and Commercialization.
- Table of contents (19 chapters)
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Introduction
Pages 1-16
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Measurement Technique of Ellipsometry
Pages 19-58
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Data Analysis
Pages 59-88
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Optical Properties of Semiconductors
Pages 89-113
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Dielectric Function Modeling
Pages 115-153
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Table of contents (19 chapters)
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Bibliographic Information
- Bibliographic Information
-
- Book Title
- Spectroscopic Ellipsometry for Photovoltaics
- Book Subtitle
- Volume 1: Fundamental Principles and Solar Cell Characterization
- Editors
-
- Hiroyuki Fujiwara
- Robert W. Collins
- Series Title
- Springer Series in Optical Sciences
- Series Volume
- 212
- Copyright
- 2018
- Publisher
- Springer International Publishing
- Copyright Holder
- Springer International Publishing AG, part of Springer Nature
- eBook ISBN
- 978-3-319-75377-5
- DOI
- 10.1007/978-3-319-75377-5
- Hardcover ISBN
- 978-3-319-75375-1
- Series ISSN
- 0342-4111
- Edition Number
- 1
- Number of Pages
- XX, 594
- Number of Illustrations
- 70 b/w illustrations, 266 illustrations in colour
- Topics
