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Contactless VLSI Measurement and Testing Techniques

Authors: Sayil, Selahattin

  • Provides a single-source reference on contactless probing approaches for VLSI testing and diagnostic measurement
  • Introduces readers to various optical contactless testing techniques, such as Electro-Optic Probing, Charge Density Probe, and Photo-emissive Probe
  • Discusses the applicability and adaptability of each technique, based on multilayer metallization, wafer level techniques, and invasiveness
  • Provides a comparison among various contactless testing techniques
  • Describes a variety of industrial applications of contactless VLSI testing
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eBook $109.00
price for USA in USD (gross)
  • ISBN 978-3-319-69673-7
  • Digitally watermarked, DRM-free
  • Included format: EPUB, PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $149.99
price for USA in USD
  • ISBN 978-3-319-69672-0
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
About this book

This book provides readers with a comprehensive overview of the state-of-the-art in optical contactless probing approaches, in order to fill a gap in the literature on VLSI Testing.  The author highlights the inherent difficulties encountered with the mechanical probe and testability design approaches for functional and internal fault testing and shows how contactless testing might resolve many of the challenges associated with conventional mechanical wafer testing. The techniques described in this book address the increasing demands for internal access of the logic state of a node within a chip under test.

About the authors

Dr. Selahattin Sayil is a Professor in the Philip M. Drayer Department of Electrical Engineering at Lamar University.  His research focuses on VLSI Testing,  Contactless Testing, Radiation effects modeling and hardening at the circuit level, Reliability analysis of low power designs, and Interconnect modeling and noise prediction.

Table of contents (10 chapters)

  • Conventional Test Methods

    Sayil, Selahattin

    Pages 1-7

  • Testability Design

    Sayil, Selahattin

    Pages 9-15

  • Other Techniques Based on the Contacting Probe

    Sayil, Selahattin

    Pages 17-24

  • Contactless Testing

    Sayil, Selahattin

    Pages 25-31

  • Electron Beam and Photoemission Probing

    Sayil, Selahattin

    Pages 33-41

Buy this book

eBook $109.00
price for USA in USD (gross)
  • ISBN 978-3-319-69673-7
  • Digitally watermarked, DRM-free
  • Included format: EPUB, PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $149.99
price for USA in USD
  • ISBN 978-3-319-69672-0
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
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Bibliographic Information

Bibliographic Information
Book Title
Contactless VLSI Measurement and Testing Techniques
Authors
Copyright
2018
Publisher
Springer International Publishing
Copyright Holder
Springer International Publishing AG
eBook ISBN
978-3-319-69673-7
DOI
10.1007/978-3-319-69673-7
Hardcover ISBN
978-3-319-69672-0
Edition Number
1
Number of Pages
V, 93
Number of Illustrations and Tables
23 b/w illustrations, 11 illustrations in colour
Topics