Overview
- Complete reference in X-Ray computed tomography (CT)
- Presents a special chapter on the calibration of CT systems
- The procedures for metrological performance verification are highlighted
Access this book
Tax calculation will be finalised at checkout
Other ways to access
Table of contents (9 chapters)
-
Front Matter
Keywords
About this book
X-ray computed tomography has been used for several decades as a tool for measuring the three-dimensional geometry of the internal organs in medicine. However, in recent years, we have seen a move in manufacturing industries for the use of X-ray computed tomography; first to give qualitative information about the internal geometry and defects in a component, and more recently, as a fully-quantitative technique for dimensional and materials analysis. This trend is primarily due to the ability of X-ray computed tomography to give a high-density and multi-scale representation of both the external and internal geometry of a component, in a non-destructive, non-contact and relatively fast way. But, due to the complexity of X-ray computed tomography, there are remaining metrological issues to solve and the specification standards are still under development. This book will act as a one-stop-shop resource for students and users of X-ray computed tomography in both academia and industry. Itpresents the fundamental principles of the technique, detailed descriptions of the various components (hardware and software), current developments in calibration and performance verification and a wealth of example applications. The book will also highlight where there is still work to do, in the perspective that X-ray computed tomography will be an essential part of Industry 4.0.
Editors and Affiliations
About the editors
Simone Carmignato is Professor of Manufacturing Engineering and Manufacturing Metrology at the University of Padua, Italy. His research activities are in the area of precision engineering and dimensional metrology, with focus on industrial computed tomography and advanced coordinate metrology. In 2012, he was awarded the F. W. Taylor Medal from CIRP, the International Academy for Production Engineering.
Wim Dewulf holds a Professorship in the Department of Mechanical Engineering at KU Leuven, Belgium, where he is leading research groups on Sustainable Engineering and on Dimensional Metrology. In the latter field, his major research themes include X-ray computed tomography, multi-sensor metrology, and automated inspection planning. He was, amongst others, coordinating the highly successful INTERAQCT project, which provided an extensive industrial-academic training environment for young researchers in the field of X-ray CT metrology.Richard Leach is Chair in Metrology at The University of Nottingham, UK, and heads up the Manufacturing Metrology Team. Richard’s current interests are the dimensional measurement of precision and additive manufactured structures. His research themes include the measurement of surface topography, development of methods for measuring 3D structures, development of methods for controlling large surfaces to high resolution in industrial applications and x-ray computed tomography.
Bibliographic Information
Book Title: Industrial X-Ray Computed Tomography
Editors: Simone Carmignato, Wim Dewulf, Richard Leach
DOI: https://doi.org/10.1007/978-3-319-59573-3
Publisher: Springer Cham
eBook Packages: Chemistry and Materials Science, Chemistry and Material Science (R0)
Copyright Information: Springer International Publishing AG 2018
Hardcover ISBN: 978-3-319-59571-9Published: 27 October 2017
Softcover ISBN: 978-3-319-86653-6Published: 23 August 2018
eBook ISBN: 978-3-319-59573-3Published: 18 October 2017
Edition Number: 1
Number of Pages: VII, 369
Number of Illustrations: 273 b/w illustrations
Topics: Characterization and Evaluation of Materials, Manufacturing, Machines, Tools, Processes, Optical and Electronic Materials, Atomic, Molecular, Optical and Plasma Physics