Soft Error Mechanisms, Modeling and Mitigation

Authors: Sayil, Selahattin

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  • Introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced jitter and race, single event coupling noise, delay and speed-up effects and then compares coupling induced noise and delay effects to single event transients and soft delays
  • Presents closed form expressions for single event crosstalk noise, delay and speed-up effects
  • Includes a reliability analysis of low power energy-efficient designs so that reader can make clever design choices that reduce static power consumption and improve soft error reliability
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eBook $74.99
price for USA in USD
  • ISBN 978-3-319-30607-0
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Hardcover $99.00
price for USA in USD
Softcover $99.00
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About this book

This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for combinational logic, the author also describes new mitigation strategies targeting commercial designs. Coverage includes novel soft error mitigation techniques such as the Dynamic Threshold Technique and Soft Error Filtering based on Transmission gate with varied gate and body bias. The discussion also includes modeling of SE crosstalk noise, delay and speed-up effects. Various mitigation strategies to eliminate SE coupling effects are also introduced. Coverage also includes the reliability of low power energy-efficient designs and the impact of leakage power consumption optimizations on soft error robustness. The author presents an analysis of various power optimization techniques, enabling readers to make design choices that reduce static power consumption and improve soft error reliability at the same time.  

About the authors

Dr. Selahattin Sayil is an Associate Professor in the Philip M. Drayer Department of Electrical Engineering at Lamar University.  His research focuses on Radiation effects modeling and hardening at the circuit level, Reliability analysis of low power designs, and Interconnect modeling and noise prediction.

Reviews

“Book gives wide perspectives on the technical insights of fundamentals of sources and mitigation strategies of soft error rates in semiconductor memory devices … . a valuable addition to a scientific library, as well as served as good introduction for memory reliability engineers or specialists and   industrials involved in the field of memory device reliability. This book is highly recommended for people who desire a better understanding of the theory and practice of SER and technical considerations in SER mitigations.” (Chong Leong Gan, Microelectronics Reliability, Vol. 74 (81), 2017)


Table of contents (9 chapters)

Table of contents (9 chapters)

Buy this book

eBook $74.99
price for USA in USD
  • ISBN 978-3-319-30607-0
  • Digitally watermarked, DRM-free
  • Included format: PDF, EPUB
  • Immediate eBook download after purchase and usable on all devices
  • Bulk discounts available
Hardcover $99.00
price for USA in USD
Softcover $99.00
price for USA in USD
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Bibliographic Information

Bibliographic Information
Book Title
Soft Error Mechanisms, Modeling and Mitigation
Authors
Copyright
2016
Publisher
Springer International Publishing
Copyright Holder
Springer International Publishing Switzerland
eBook ISBN
978-3-319-30607-0
DOI
10.1007/978-3-319-30607-0
Hardcover ISBN
978-3-319-30606-3
Softcover ISBN
978-3-319-80848-2
Edition Number
1
Number of Pages
XI, 105
Number of Illustrations
46 b/w illustrations, 35 illustrations in colour
Topics