Authors:
- Describes in detail the ESD phenomenon, as well as ESD protection fundamentals, standards, test equipment, and basic design strategies
- Enables readers to design effective ESD protection solutions for all mainstream RF fabrication processes (GaAs pHEMT, SiGe HBT, CMOS)
- Includes realistic case studies of ESD protection for RFICs that resulted in significantly increased ESD safety level, while maximizing RF performance
- Includes supplementary material: sn.pub/extras
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Table of contents (5 chapters)
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Front Matter
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Back Matter
About this book
Authors and Affiliations
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New England Design Center, TriQuint Semiconductor, Chelmsford, USA
Qiang Cui
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University of Central Florida, Orlando, USA
Juin J. Liou
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Analog Devices Inc., Wilmington, USA
Jean-Jacques Hajjar, Javier Salcedo, Yuanzhong Zhou, Parthasarathy Srivatsan
About the authors
Dr. Qiang Cui received his B.S, M.S and PhD in Electrical Engineering in 2006, 2008, 2013 respectively. His research work includes Radio Frequency Integrated Circuits (RFIC) Design and Reliability. His research work has been referenced in publications and also applied to industry application. He is now a senior RF IC design engineer in RF Micro Devices (RFMD).
Juin J. Liou received the B.S. (honors), M.S., and Ph.D. degrees in electrical engineering from the University of Florida, Gainesville, in 1982, 1983, and 1987, respectively. He is now with the School of EECS at the University of Central Florida (UCF). His current research interests are electrostatic discharge (ESD) protection design, modeling, and simulation.
 Dr. Liou has been awarded 8 U.S. patents, and has published 10 books, 2 book chapter, more than 270 journal papers, and more than 220 papers in international and national conference proceedings. Dr. Liou was awarded the UCF Pegasus Distinguished Professor in 2009 – the highest honor bestowed to a faculty member at UCF, UCF Distinguished Researcher Award in 1992, 1998, 2002, and 2009, and IEEE Joseph M. Biedenbach Outstanding Engineering Educator Award in 2004. His other honors are Fellow of IEEE, Fellow of IET, Fang Chia Chair Professor of Fang Chia University, Taiwan, and Chang Jiang Endowed Professor of Ministry of Education, China – the highest honorary professorship in China.
Dr. Javier A. Salcedo is a Technology Development Engineer at Analog Devices (ADI), Wilmington, Massachusetts. Dr. Salcedo’s technical publications and inventions in electron devices technology are regularly referenced in the literature and have been adopted in the semiconductor industry to enable new IC applications for consumer electronics, communication infrastructure, healthcare systems, automotive electronics and industrial control applications. Dr. Salcedo is a recipient of the Institute of Electrical and Electronics Engineers (IEEE)Electron Devices Society (EDS) Ph.D. Fellowship, member of the American Association for the Advancement of Science (AAAS), member of the Electrostatic Discharge Association (ESDA) and a Senior Member of the IEEE.
Bibliographic Information
Book Title: On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits
Authors: Qiang Cui, Juin J. Liou, Jean-Jacques Hajjar, Javier Salcedo, Yuanzhong Zhou, Parthasarathy Srivatsan
DOI: https://doi.org/10.1007/978-3-319-10819-3
Publisher: Springer Cham
eBook Packages: Engineering, Engineering (R0)
Copyright Information: Springer International Publishing Switzerland 2015
Hardcover ISBN: 978-3-319-10818-6Published: 26 March 2015
Softcover ISBN: 978-3-319-35824-6Published: 06 October 2016
eBook ISBN: 978-3-319-10819-3Published: 10 March 2015
Edition Number: 1
Number of Pages: XVII, 86
Number of Illustrations: 17 b/w illustrations, 42 illustrations in colour
Topics: Circuits and Systems, Electronic Circuits and Devices, Electronics and Microelectronics, Instrumentation