Overview
- Describes the intricacies of hot carrier degradation in modern semiconductor technologies
- Covers the entire hot carrier degradation phenomenon, including topics such as characterization, carrier transport, carrier-defect interaction, technological impact, circuit impact, etc
- Enables detailed understanding of carrier transport, interaction of the carrier ensemble with the defect precursors, and an accurate assessment of how the newly created defects impact the device performance
- Covers modeling issues starting from detailed physics-based TCAD approaches up to efficient SPICE-compatible compact models
- Includes supplementary material: sn.pub/extras
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Table of contents (16 chapters)
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Front Matter
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Beyond Lucky Electrons
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Front Matter
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CMOS and Beyond
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Front Matter
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Keywords
About this book
This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today’s most complicated reliability issues in semiconductor devices. Coverage includes an explanation of carrier transport within devices and book-keeping of how they acquire energy (“become hot”), interaction of an ensemble of colder and hotter carriers with defect precursors, which eventually leads to the creation of a defect, and a description of how these defects interact with the device, degrading its performance.
Editors and Affiliations
About the editor
Bibliographic Information
Book Title: Hot Carrier Degradation in Semiconductor Devices
Editors: Tibor Grasser
DOI: https://doi.org/10.1007/978-3-319-08994-2
Publisher: Springer Cham
eBook Packages: Engineering, Engineering (R0)
Copyright Information: Springer International Publishing Switzerland 2015
Hardcover ISBN: 978-3-319-08993-5Published: 27 November 2014
Softcover ISBN: 978-3-319-35912-0Published: 24 September 2016
eBook ISBN: 978-3-319-08994-2Published: 29 October 2014
Edition Number: 1
Number of Pages: X, 517
Number of Illustrations: 99 b/w illustrations, 253 illustrations in colour
Topics: Circuits and Systems, Electronic Circuits and Devices, Electronics and Microelectronics, Instrumentation