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  • © 2015

Arbitrary Modeling of TSVs for 3D Integrated Circuits

  • Introduces a robust model that captures accurately all the loss modes of a TSV, coupling parasitics between TSVs and the TSV nonlinear capacitance and resistance of the depletion region
  • Enables readers to use a model which is technology dependent and can be used for any TSV configuration
  • Reveals a novel on-chip wireless communication technique, based on TSV spiral inductors
  • Equips readers for fast parasitic extraction of TSVs for 3D IC design
  • Includes supplementary material: sn.pub/extras

Part of the book series: Analog Circuits and Signal Processing (ACSP)

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Table of contents (10 chapters)

  1. Front Matter

    Pages i-ix
  2. Introduction: Work Around Moore’s Law

    • Khaled Salah, Yehea Ismail, Alaa El-Rouby
    Pages 1-15
  3. 3D/TSV-Enabling Technologies

    • Khaled Salah, Yehea Ismail, Alaa El-Rouby
    Pages 17-47
  4. TSV Modeling and Analysis

    • Khaled Salah, Yehea Ismail, Alaa El-Rouby
    Pages 49-83
  5. TSV Verification

    • Khaled Salah, Yehea Ismail, Alaa El-Rouby
    Pages 85-94
  6. TSV Macro-Modeling Framework

    • Khaled Salah, Yehea Ismail, Alaa El-Rouby
    Pages 95-101
  7. Imperfection in TSV Modeling

    • Khaled Salah, Yehea Ismail, Alaa El-Rouby
    Pages 133-147
  8. New Trends in TSV

    • Khaled Salah, Yehea Ismail, Alaa El-Rouby
    Pages 149-162
  9. TSV Fabrication

    • Khaled Salah, Yehea Ismail, Alaa El-Rouby
    Pages 163-172
  10. Conclusions

    • Khaled Salah, Yehea Ismail, Alaa El-Rouby
    Pages 173-175
  11. Back Matter

    Pages 177-179

About this book

This book presents a wide-band and technology independent, SPICE-compatible RLC model for through-silicon vias (TSVs) in 3D integrated circuits. This model accounts for a variety of effects, including skin effect, depletion capacitance and nearby contact effects. Readers will benefit from in-depth coverage of concepts and technology such as 3D integration, Macro modeling, dimensional analysis and compact modeling, as well as closed form equations for the through silicon via parasitics. Concepts covered are demonstrated by using TSVs in applications such as a spiral inductor and inductive-based communication system and bandpass filtering.

Authors and Affiliations

  • Mentor Graphics, Heliopolis, Egypt

    Khaled Salah, Alaa El-Rouby

  • The American University (New Cairo) and Zewail City of Science and Technology (6th of October City), New Cairo, Egypt

    Yehea Ismail

Bibliographic Information

  • Book Title: Arbitrary Modeling of TSVs for 3D Integrated Circuits

  • Authors: Khaled Salah, Yehea Ismail, Alaa El-Rouby

  • Series Title: Analog Circuits and Signal Processing

  • DOI: https://doi.org/10.1007/978-3-319-07611-9

  • Publisher: Springer Cham

  • eBook Packages: Engineering, Engineering (R0)

  • Copyright Information: Springer International Publishing Switzerland 2015

  • Hardcover ISBN: 978-3-319-07610-2Published: 05 September 2014

  • Softcover ISBN: 978-3-319-37497-0Published: 23 August 2016

  • eBook ISBN: 978-3-319-07611-9Published: 21 August 2014

  • Series ISSN: 1872-082X

  • Series E-ISSN: 2197-1854

  • Edition Number: 1

  • Number of Pages: IX, 179

  • Number of Illustrations: 60 b/w illustrations, 99 illustrations in colour

  • Topics: Circuits and Systems, Electronics and Microelectronics, Instrumentation, Processor Architectures

Buy it now

Buying options

eBook USD 84.99
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book USD 109.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book USD 109.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Other ways to access