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Mikrochimica Acta Supplementa Mikrochimica Acta Supplementa Grasserbauer,M.(Eds):Progr.(closed)

Progress in Materials Analysis

Vol. 2

Editors: Grasserbauer, M., Wegscheider, W. (Eds.)

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  • ISBN 978-3-7091-8840-8
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About this book

Vol. 2 of "Progress in Materials Analysis" contains the lectures of the 12th Colloquium on Materials Analysis, Vienna, May 13-15, 1985. Due to the top level international participation from industry and research insti­ tutions the proceedings offer a survey of the present state and current trends in materials analysis of high actuality. The major topics covered are surface, micro and trace analysis of materials with a special emphasis on metals but also including other materials like ceramics, semiconductors, polymers. According to the strategy of the meeting attention is focussed on an interdisciplinary approach to materials science - combining analytical chemistry, solid state physics and technol­ ogy. Therefore progress reports on modern analytical technique like SIMS, SNMS, AES, XPS, Positron Annihilation Spectroscopy, EPMA, STEM, LAMMS, etc. are contained as well as presentations on the development of materials. The majority of the contributions centers on the treatment of important problems in materials science and technology by a (mostly sophisticated) combination of physical and chemical analytical techniques. Vienna, July 1985 M. Grasserbauer Contents Page Hercules, D. M. Surface Characterization of Thin Organic Films on Metals ............................................. .

Table of contents (28 chapters)

Table of contents (28 chapters)
  • Surface Characterization of Thin Organic Films on Metals

    Pages 1-28

    Hercules, Professor D. M.

  • Analysis of Very Thin Organic Fibres by Means of Small Spots Electron Spectroscopy for Chemical Analysis

    Pages 29-32

    Daiser, S. M. (et al.)

  • Ion Implantation in the Surface Analysis of Solid Materials

    Pages 33-47

    Gries, Dr. W. H.

  • Comparison of Ion Implantation Profiles Obtained by AES/Sputtering Measurements and Monte Carlo Calculations

    Pages 49-69

    Bubert, Dr. H.

  • Microfocussed Ion Beams for Surface Analysis and Depth Profiling

    Pages 71-78

    Preuss, Dr. M. (et al.)

Buy this book

eBook $84.99
price for USA in USD (gross)
  • ISBN 978-3-7091-8840-8
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Softcover $109.00
price for USA in USD
  • ISBN 978-3-211-81905-0
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
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Bibliographic Information

Bibliographic Information
Book Title
Progress in Materials Analysis
Book Subtitle
Vol. 2
Editors
  • M. Grasserbauer
  • W. Wegscheider
Series Title
Mikrochimica Acta Supplementa
Series Volume
11
Copyright
1985
Publisher
Springer-Verlag Wien
Copyright Holder
Springer-Verlag/Wien
eBook ISBN
978-3-7091-8840-8
DOI
10.1007/978-3-7091-8840-8
Softcover ISBN
978-3-211-81905-0
Series ISSN
0076-8642
Edition Number
1
Number of Pages
X, 382
Topics