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  • © 2005

System-level Test and Validation of Hardware/Software Systems

  • The reader will learn about the state of the art in system-level validation and test procedures which will enhance both the reliability and performance of system on chip designs

Part of the book series: Springer Series in Advanced Microelectronics (MICROELECTR., volume 17)

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Table of contents (9 chapters)

  1. Front Matter

    Pages i-xii
  2. Introduction

    • Z. Peng, M. Sonza Reorda, M. Violante
    Pages 1-3
  3. Modeling Permanent Faults

    • J. P. Teixeira
    Pages 5-25
  4. Test Generation: A Symbolic Approach

    • F. Fummi, G. Pravadelli
    Pages 27-46
  5. Test Generation: A Heuristic Approach

    • O. Goloubeva, M. Sonza Reorda, M. Violante
    Pages 47-65
  6. Test Generation: A Hierarchical Approach

    • G. Jervan, R. Ubar, Z. Peng, P. Eles
    Pages 67-81
  7. Test Program Generation from High-level Microprocessor Descriptions

    • E. Sánchez, M. Sonza Reorda, G. Squillero
    Pages 83-106
  8. Tackling Concurrency and Timing Problems

    • I. G. Harris
    Pages 107-120
  9. An Approach to System-level Design for Test

    • G. Jervan, R. Ubar, Z. Peng, P. Eles
    Pages 121-149
  10. System-level Dependability Analysis

    • A. Bobbio, D. Codetta Raiteri, M. De Pierro, G. Franceschinis
    Pages 151-174
  11. Back Matter

    Pages 175-179

About this book

New manufacturing technologies have made possible the integration of entire systems on a single chip. This new design paradigm, termed system-on-chip (SOC), together with its associated manufacturing problems, represents a real challenge for designers.

SOC is also reshaping approaches to test and validation activities. These are beginning to migrate from the traditional register-transfer or gate levels of abstraction to the system level. Until now, test and validation have not been supported by system-level design tools so designers have lacked the infrastructure to exploit all the benefits stemming from the adoption of the system level of abstraction. Research efforts are already addressing this issue.

This monograph provides a state-of-the-art overview of the current validation and test techniques by covering all aspects of the subject including:

  • modeling of bugs and defects;
  • stimulus generation for validation and test purposes (including timing errors;
  • design for testability.

Editors and Affiliations

  • Dipartimento di Automatica e Informatica, Politecnico di Torino, Torino, Italy

    Matteo Sonza Reorda, Massimo Violante

  • Department of Computer and Information Science, Linköping University, Linköping, Sweden

    Zebo Peng

About the editors

Matteo Sonza Reorda is the leader of the computer-aided design group of the Dipartimento di Automatica e Informatica, Politecnico di Torino. Zebo Peng is Professor of the chair in Computer Systems and Director of the Embedded Systems Laboratory at Linköping University.

Bibliographic Information

Buy it now

Buying options

eBook USD 84.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book USD 109.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book USD 109.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Other ways to access