Authors:
- Covers a variety of data-driven process monitoring techniques
- Includes detailed applications in chemical plant simulation
- Expanded text with more homework problems and graphically-illustrated examples
Part of the book series: Advanced Textbooks in Control and Signal Processing (C&SP)
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Table of contents (12 chapters)
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Front Matter
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Introduction
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Front Matter
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Background
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Front Matter
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Data-driven Methods
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Front Matter
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Application
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Front Matter
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Analytical and Knowledge-based Methods
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Front Matter
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Back Matter
About this book
The goal of the book is to present the theoretical background and practical techniques for data-driven process monitoring. Process monitoring techniques presented include: Data-driven methods - principal component analysis, Fisher discriminant analysis, partial least squares and canonical variate analysis; Analytical Methods - parameter estimation, observer-based methods and parity relations; Knowledge-based methods - causal analysis, expert systems and pattern recognition.
The text demonstrates the application of all of the data-driven process monitoring techniques to the Tennessee Eastman plant simulator - demonstrating the strengths and weaknesses of each approach in detail. This aids the reader in selecting the right method for his process application. Plant simulator and homework problems in which students apply the process monitoring techniques to a non-trivial simulated process, and can compare their performance with that obtained in the case studies in the text are included. A number of additional homework problems encourage the reader to implement and obtain a deeper understanding of the techniques. The reader will obtain a background in data-driven techniques for fault detection and diagnosis, including the ability to implement the techniques and to know how to select the right technique for a particular application.
Authors and Affiliations
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Department of Chemical Engineering, University of Illinois at Urbana-Champaign, Urbana, USA
Leo H. Chiang, Richard D. Braatz
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ExxonMobil Upstream Reasearch Company, Houston, USA
Evan L. Russell
Bibliographic Information
Book Title: Fault Detection and Diagnosis in Industrial Systems
Authors: Leo H. Chiang, Evan L. Russell, Richard D. Braatz
Series Title: Advanced Textbooks in Control and Signal Processing
DOI: https://doi.org/10.1007/978-1-4471-0347-9
Publisher: Springer London
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eBook Packages: Springer Book Archive
Copyright Information: Springer-Verlag London 2001
Softcover ISBN: 978-1-85233-327-0Published: 11 December 2000
eBook ISBN: 978-1-4471-0347-9Published: 06 December 2012
Series ISSN: 1439-2232
Series E-ISSN: 2510-3814
Edition Number: 1
Number of Pages: XIV, 279
Number of Illustrations: 5 b/w illustrations
Topics: Control and Systems Theory, Data Structures, Industrial Chemistry/Chemical Engineering