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CMOS Test and Evaluation

A Physical Perspective

Authors: Bhushan, Manjul, Ketchen, Mark B.

  • Relates CMOS product performance to basic physical models of transistors and passive elements
  • Uses embedded test structures and sensors for product test debug, yield and performance evaluation
  • Describes impact of device variability
  • Discusses application corners, schmooing and product specifications including guardbands
  • Presents an overall view of CMOS product chip test, test equipment and diagnostic tools
  • Describes data analysis techniques for rapid evaluation and debug during test
  • Features nearly 300 illustrations
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eBook $109.00
price for USA in USD (gross)
  • ISBN 978-1-4939-1349-7
  • Digitally watermarked, DRM-free
  • Included format: EPUB, PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $179.99
price for USA in USD
  • ISBN 978-1-4939-1348-0
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $139.99
price for USA in USD
  • ISBN 978-1-4939-4702-7
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
About this book

CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range.

About the authors

Manjul Bhushan is a technical consultant in New York.

Mark Ketchen is a technical consultant in Massachusetts.

Table of contents (10 chapters)

Buy this book

eBook $109.00
price for USA in USD (gross)
  • ISBN 978-1-4939-1349-7
  • Digitally watermarked, DRM-free
  • Included format: EPUB, PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $179.99
price for USA in USD
  • ISBN 978-1-4939-1348-0
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $139.99
price for USA in USD
  • ISBN 978-1-4939-4702-7
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
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Bibliographic Information

Bibliographic Information
Book Title
CMOS Test and Evaluation
Book Subtitle
A Physical Perspective
Authors
Copyright
2015
Publisher
Springer-Verlag New York
Copyright Holder
Springer Science+Business Media New York
eBook ISBN
978-1-4939-1349-7
DOI
10.1007/978-1-4939-1349-7
Hardcover ISBN
978-1-4939-1348-0
Softcover ISBN
978-1-4939-4702-7
Edition Number
1
Number of Pages
XIII, 424
Number of Illustrations and Tables
338 b/w illustrations
Topics