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High-Resolution X-Ray Scattering

From Thin Films to Lateral Nanostructures

  • Textbook
  • © 2004

Overview

Authors:
  1. Ullrich Pietsch

    1. Institute of Physics, University of Potsdam, Potsdam, Germany

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  2. Václav Holý

    1. Department of Solid State Physics, Masaryk University, Brno, Czech Republic

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  3. Tilo Baumbach

    1. Institut fuer Synchrotronstrahlung, Forschungszentrum Karlsruhe in der Helmholtz-Gemeinschaft, Karlsruhe, Germany

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Part of the book series: Advanced Texts in Physics (ADTP)

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Table of contents (14 chapters)

  1. Front Matter

    Pages I-XVI
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  2. Experimental Realization

    1. Front Matter

      Pages 1-3
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    2. Elements for Designing an X-Ray Diffraction Experiment

      • Ullrich Pietsch, Václav Holý, Tilo Baumbach
      Pages 5-29

    3. Diffractometers and Reflectometers

      • Ullrich Pietsch, Václav Holý, Tilo Baumbach
      Pages 31-42

    4. Scans and Resolution in Angular and Reciprocal Space

      • Ullrich Pietsch, Václav Holý, Tilo Baumbach
      Pages 43-58

  3. Basic Principles

    1. Front Matter

      Pages 59-62
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    2. Basic Principles

      • Ullrich Pietsch, Václav Holý, Tilo Baumbach
      Pages 63-74

    3. Kinematical Theory

      • Ullrich Pietsch, Václav Holý, Tilo Baumbach
      Pages 75-95

    4. Dynamical Theory

      • Ullrich Pietsch, Václav Holý, Tilo Baumbach
      Pages 97-121

    5. Semikinematical Theory

      • Ullrich Pietsch, Václav Holý, Tilo Baumbach
      Pages 123-135

  4. Solution of Experimental Problems

    1. Front Matter

      Pages 137-141
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    2. Determination of Layer Thicknesses of Single Layers and Multilayers

      • Ullrich Pietsch, Václav Holý, Tilo Baumbach
      Pages 143-178

    3. Lattice Parameters and Strains in Epitaxial Layers and Multilayers

      • Ullrich Pietsch, Václav Holý, Tilo Baumbach
      Pages 179-203

    4. Diffuse Scattering From Volume Defects in Thin Layers

      • Ullrich Pietsch, Václav Holý, Tilo Baumbach
      Pages 205-233

    5. X-Ray Scattering by Rough Multilayers

      • Ullrich Pietsch, Václav Holý, Tilo Baumbach
      Pages 235-272

  5. X-Ray Scattering by Laterally Structured Semiconductor Nano-Structures

    1. Front Matter

      Pages 273-278
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    2. X-Ray Scattering by Artificially Lateral Semiconductor Nanostructures

      • Ullrich Pietsch, Václav Holý, Tilo Baumbach
      Pages 279-316

    3. Strain Analysis in Periodic Nanostructures

      • Ullrich Pietsch, Václav Holý, Tilo Baumbach
      Pages 317-352

    4. X-Ray Scattering from Self-Organized Structures

      • Ullrich Pietsch, Václav Holý, Tilo Baumbach
      Pages 353-387

  6. Back Matter

    Pages 389-408
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Keywords

About this book

During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer thicknesses are scaled down to a few atomic layers in order to exploit quantum effects. For reasons of electronic and optical confinement, these thin layers are embedded within much thicker cladding layers or stacks of multilayers of slightly different chemical composition. It is evident that the interface quality of those quantum weHs is quite important for the function of devices. Thin metallic layers often show magnetic properties which do not ap­ pear for thick layers or in bulk material. The investigation of the mutual interaction of magnetic and non-magnetic layers leads to the discovery of colossal magnetoresistance, for example. This property is strongly related to the thickness and interface roughness of covered layers.

Authors and Affiliations

  • Institute of Physics, University of Potsdam, Potsdam, Germany

    Ullrich Pietsch

  • Department of Solid State Physics, Masaryk University, Brno, Czech Republic

    Václav Holý

  • Institut fuer Synchrotronstrahlung, Forschungszentrum Karlsruhe in der Helmholtz-Gemeinschaft, Karlsruhe, Germany

    Tilo Baumbach

Bibliographic Information

  • Book Title: High-Resolution X-Ray Scattering

  • Book Subtitle: From Thin Films to Lateral Nanostructures

  • Authors: Ullrich Pietsch, Václav Holý, Tilo Baumbach

  • Series Title: Advanced Texts in Physics

  • DOI: https://doi.org/10.1007/978-1-4757-4050-9

  • Publisher: Springer New York, NY

  • eBook Packages: Springer Book Archive

  • Copyright Information: Springer Science+Business Media New York 2004

  • Hardcover ISBN: 978-0-387-40092-1Published: 27 August 2004

  • Softcover ISBN: 978-1-4419-2307-3Published: 12 December 2011

  • eBook ISBN: 978-1-4757-4050-9Published: 09 March 2013

  • Series ISSN: 1439-2674

  • Edition Number: 2

  • Number of Pages: XVI, 408

  • Number of Illustrations: 389 b/w illustrations

  • Additional Information: Originally published as Volume 149 in the series: Springer Tracts in Modern Physics

  • Topics: Surfaces and Interfaces, Thin Films, Optical and Electronic Materials, Nanotechnology, Optics, Lasers, Photonics, Optical Devices

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