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Transmission Electron Microscopy

A Textbook for Materials Science

Authors: Williams, David B., Carter, C. Barry

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  • ISBN 978-1-4757-2519-3
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About this Textbook

Electron microscopy has revolutionized our understanding the extraordinary intellectual demands required of the mi­ of materials by completing the processing-structure-prop­ croscopist in order to do the job properly: crystallography, erties links down to atomistic levels. It now is even possible diffraction, image contrast, inelastic scattering events, and to tailor the microstructure (and meso structure ) of materials spectroscopy. Remember, these used to be fields in them­ to achieve specific sets of properties; the extraordinary abili­ selves. Today, one has to understand the fundamentals ties of modem transmission electron microscopy-TEM­ of all of these areas before one can hope to tackle signifi­ instruments to provide almost all of the structural, phase, cant problems in materials science. TEM is a technique of and crystallographic data allow us to accomplish this feat. characterizing materials down to the atomic limits. It must Therefore, it is obvious that any curriculum in modem mate­ be used with care and attention, in many cases involving rials education must include suitable courses in electron mi­ teams of experts from different venues. The fundamentals croscopy. It is also essential that suitable texts be available are, of course, based in physics, so aspiring materials sci­ for the preparation of the students and researchers who must entists would be well advised to have prior exposure to, for carry out electron microscopy properly and quantitatively.

Reviews

`The best textbook for this audience available.'
American Scientist, January-February 1998
`Ideally suited to the needs of a graduate level course. It is hard to imagine this book not fulfilling most of the requirements of a text for such a course.'
Microscope
`This book is written in such a comprehensive manner that it is understandable to all people who are trained in physical science and it will be useful both for the expert as well as the student.'
Micron
`The book answers nearly any question - be it instrumental, practical, or theoretical - either directly or with an appropriate reference...This book provides a basic, clearcut presentation of how transmission electron microscopes should be used and of how this depends specifically on one's specific undergoing project.'
MRS Bulletin, May 1998
`The only complete text now available which includes all the remarkable advances made in the field of TEM in the past 30-40 years....The authors can be proud of an enormous task, very well done.'
from the Foreword by Professor Gareth Thomas, University of California, Berkeley

Table of contents (40 chapters)

  • The Transmission Electron Microscope

    Williams, David B. (et al.)

    Pages 3-17

  • Scattering and Diffraction

    Williams, David B. (et al.)

    Pages 19-33

  • Elastic Scattering

    Williams, David B. (et al.)

    Pages 35-47

  • Inelastic Scattering and Beam Damage

    Williams, David B. (et al.)

    Pages 49-65

  • Electron Sources

    Williams, David B. (et al.)

    Pages 67-83

Buy this book

eBook $74.99
price for USA in USD (gross)
  • ISBN 978-1-4757-2519-3
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
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Bibliographic Information

Bibliographic Information
Book Title
Transmission Electron Microscopy
Book Subtitle
A Textbook for Materials Science
Authors
Copyright
1996
Publisher
Springer US
Copyright Holder
Springer Science+Business Media New York
eBook ISBN
978-1-4757-2519-3
DOI
10.1007/978-1-4757-2519-3
Edition Number
1
Number of Pages
XXIX, 729
Number of Illustrations and Tables
1722 b/w illustrations
Topics