Reflection High-Energy Electron Diffraction and Reflection Electron Imaging of Surfaces

1. Front Matter

   Pages i-xiii

   PDF

2. Surface Structural Determination

   1. Front Matter

      Pages 1-1

      PDF

   2. Experimental

      1. Experimental Overview of Surface Structure Determination by RHEED

         • S. Ino

         Pages 3-28

   3. Theory

      1. Surface Structural Determination Using RHEED

         • J. L. Beeby

         Pages 29-42

      2. Theory of RHEED by Reconstructed Surfaces

         • M. G. Knibb, P. A. Maksym

         Pages 43-62

      3. Accurate Dynamical Theory for RHEED Rocking-Curve Intensity Spectra

         • S. Y. Tong, T. C. Zhao, H. C. Poon

         Pages 63-75

   4. Inelastic Effects

      1. Inelastic Scattering Effects in RHEED and Reflection Imaging

         • A. L. Bleloch, A. Howie, R. H. Milne, M. G. Walls

         Pages 77-89

      2. Excitation of Dielectric Spheres by Electron Beams

         • P. M. Echenique

         Pages 91-95

3. Resonance and Channeling Effects

   1. Front Matter

      Pages 97-97

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   2. Resonance Effects in RHEED

      • G. Meyer-Ehmsen

      Pages 99-107

   3. Inelastic Scattering and Secondary Electron Emission under Resonance Conditions in RHEED from Pt(111)

      • H. Marten

      Pages 109-115

   4. Adatom Site Determination using Channeling Effects in RHEED on X-ray and Auger Electron Production

      • J. C. H. Spence, Y. Kim

      Pages 117-129

   5. A Note on the Bloch Wave and Integral Formulations of RHEED Theory

      • Jon Gjønnes

      Pages 131-136

4. Disorders and Steps in Electron Diffraction

   1. Front Matter

      Pages 137-137

      PDF

   2. Diffraction from Disordered Surfaces: An Overview

      • M. G. Lagally, D. E. Savage, M. C. Tringides

      Pages 139-174

   3. Theory of Electron Scattering from Defect: Steps on Surfaces with Non-Equivalent Terraces

      • W. Moritz

      Pages 175-191

   4. Diffraction from Stepped Surfaces

      • M. Henzler

      Pages 193-199

   5. RHEED and Disordered Surfaces

      • B. Bölger, P. K. Larsen, G. Meyer Ehmsen

      Pages 201-209

   6. Temperature Diffuse Scattering in RHEED

      • M. Albrecht, G. Meyer-Ehmsen

      Pages 211-216

   7. Temperature Dependence of the Surface Disorder on Ge(001) Due to Ar+ Ion Bombardment

      • A. J. Hoeven, J. S. C. Kools, J. Aarts, P. C. Zalm

      Pages 217-224

This volume contains the papers presented at the NATO Advanced Research Workshop in "Reflection High Energy Electron Diffraction and Reflection Electron Imaging of Surfaces" held at the Koningshof conference center, Veldhoven, the Netherlands, June 15-19, 1987. The main topics of the workshop, Reflection High Energy Electron Diffraction (RHEED) and Reflection Electron Microscopy (REM), have a common basis in the diffraction processes which high energy electrons undergo when they interact with solid surfaces at grazing angles. However, while REM is a new technique developed on the basis of recent advances in transmission electron microscopy, RHEED is an old method in surface crystallography going back to the discovery of electron diffraction in 1927 by Davisson and Germer. Until the development of ultra high vacuum techniques in the 1960's made instruments using slow electrons more accessable, RHEED was the dominating electron diffraction technique. Since then and until recently the method of Low Energy Electron Diffraction (LEED) largely surpassed RHEED in popularity in surface studies. The two methods are closely related of course, each with its own specific advantages. The grazing angle geometry of RHEED has now become a very useful feature because this makes it ideally suited for combination with the thin growth technique of Molecular Beam Epitaxy (MBE). This combination allows in-situ studies of freshly grown and even growing surfaces, opening up new areas of research of both fundamental and technological importance.

• crystal
• crystallography
• electron
• electron microscopy
• microscopy
• transmission electron microscopy

• Philips Research Laboratories, Eindhoven, The Netherlands

  P. K. Larsen

• Philips Research Laboratories, Redhill, UK

  P. J. Dobson

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